2018
DOI: 10.1109/lca.2017.2766221
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Sensing CPU Voltage Noise Through Electromagnetic Emanations

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Cited by 11 publications
(9 citation statements)
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“…Cache viruses were crafted to exploit the underlying microarchitecture and test all levels of the cache hierarchy, while core viruses are being generated by genetic algorithms. To stress the cores, we use dI/dt viruses that cause the CPU power consumption to switch between high and low power at a rate equal to PDN 1 st order resonant frequency [2,8,14]. This causes maximum voltage noise.…”
Section: Cstress-test Developmentmentioning
confidence: 99%
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“…Cache viruses were crafted to exploit the underlying microarchitecture and test all levels of the cache hierarchy, while core viruses are being generated by genetic algorithms. To stress the cores, we use dI/dt viruses that cause the CPU power consumption to switch between high and low power at a rate equal to PDN 1 st order resonant frequency [2,8,14]. This causes maximum voltage noise.…”
Section: Cstress-test Developmentmentioning
confidence: 99%
“…This causes maximum voltage noise. We craft this virus using the approach described in [14]. Such viruses represent a pathogenic worst-case scenario that is unlikely to be encountered in real-life workloads targeting to cause maximum voltage noise, power consumption and error rates.…”
Section: Cstress-test Developmentmentioning
confidence: 99%
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