Semiparametric evaluation of first‐passage distribution for step‐stress accelerated degradation tests
Lochana Palayangoda,
Hon Keung Tony Ng,
Ling Li
Abstract:In reliability engineering, different types of accelerated degradation tests have been used to obtain reliability information for evaluating highly reliable or expensive products. The step‐stress accelerated degradation test (SSADT) is one of the useful experimental schemes that can be used to save the resources of an experiment. Motivated by the SSADT data for operational amplifiers collected in Xi'an Microelectronic Technology Institute, in which the underlying degradation mechanism of the operational amplif… Show more
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