1996
DOI: 10.1103/physreva.54.4127
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Semiempirical scaling laws for electron capture at low energies

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Cited by 61 publications
(55 citation statements)
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“…In the slow collisions of multiply charged ions with He gas, single-electron capture (SEC), true double-electron capture (TDC), and transfer ionization (TI) take place as inelastic reaction processes. Generally speaking, SEC can be regarded as the most dominant one as seen in collisions of Xe q+ (q = 10-43 ) and Ar q+ (q = 8-16) [21,22,23]. Therefore, we can assume that the observed emissions come from the ions in one less charge states than the incident ionic charge q+, i.e.…”
Section: Resultsmentioning
confidence: 99%
“…In the slow collisions of multiply charged ions with He gas, single-electron capture (SEC), true double-electron capture (TDC), and transfer ionization (TI) take place as inelastic reaction processes. Generally speaking, SEC can be regarded as the most dominant one as seen in collisions of Xe q+ (q = 10-43 ) and Ar q+ (q = 8-16) [21,22,23]. Therefore, we can assume that the observed emissions come from the ions in one less charge states than the incident ionic charge q+, i.e.…”
Section: Resultsmentioning
confidence: 99%
“…The charge exchange cross-section [63] (in cm2) for multiple electron transfer can be approximatecl for slow collisions (this expression is valid for collision velocities below roughiy 0.2 a.u.) as ci-i-, : (z.T x ro*13) zi, llü t it, l t?ll, (2 23) where the electrons.…”
Section: The Electron-irnpact Ionization Process Ismentioning
confidence: 99%
“…In fact, as seen in Fig. 10 for EC of U q+ ions colliding with Ar targets at 3.5 MeV/u, the sum of multipleelectron capture cross sections is comparable to or even larger than that for the single-electron capture process (see also [26,28,30,31]). Moreover, MEC cross sections are of great importance to the design of scrapers, beam dumps, and pumping systems dedicated for catching charge-changed ions and desorbed material at certain [10]; N singleelectron cross section [16]; h single-electron cross section [17].…”
Section: Multiple-electron Capture (Mec)mentioning
confidence: 88%