2021
DOI: 10.1109/access.2021.3117576
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Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms

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Cited by 6 publications
(5 citation statements)
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“…A lot of papers, 2,4,6,11,[13][14][15][16][17][18][19][20][21][22][23] however, investigate yield prediction with supervised regression models. They are summarised in Table 2.…”
Section: Regression Modelsmentioning
confidence: 99%
See 3 more Smart Citations
“…A lot of papers, 2,4,6,11,[13][14][15][16][17][18][19][20][21][22][23] however, investigate yield prediction with supervised regression models. They are summarised in Table 2.…”
Section: Regression Modelsmentioning
confidence: 99%
“…It is interesting to look at the performance of the methods in relation to the underlying data. A number of authors 4,11,13,14,17,19,20,23,26 work with Wafer Test data/ Wafer Acceptance Test(WAT) which is also refered to Process Control Monitoring(PCM) data. Jiang et al 13,14 and Kim 20 et al had results above 0.9 for R 2 values.…”
Section: Regression Modelsmentioning
confidence: 99%
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“…The semiconductor industry has been experiencing growth and advancement in chip development, but the shortage has highlighted the need for strategies to address the crisis. The optimization of manufacturing yield has become crucial in semiconductor operations due to the increasing cost of fabrication and global supply shortage situations(Jiang et al, 2021). In response to the shortage, strategies include adopting innovative strategies to mitigate supply chain disruptions, such as using data analytics for operational risk management and developing innovative manufacturing focusing on big data.…”
mentioning
confidence: 99%