Semiconductor electrical parameter measurement based on Hall effect and the improved mobility spectrum algorithm

Wang, Xin; Zhou, Ruiqiang; Zhang, Yujie; Fan, Xianguang

doi:10.1016/j.measurement.2024.115257

Measurement

2024

DOI: 10.1016/j.measurement.2024.115257

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Semiconductor electrical parameter measurement based on Hall effect and the improved mobility spectrum algorithm

Xin Wang,

Ruiqiang Zhou,

Yujie Zhang

et al.

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Semiconductor electrical parameter measurement based on Hall effect and the improved mobility spectrum algorithm

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References 13 publications

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