2013
DOI: 10.1002/zamm.201100171
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Semiconductor device optimization in the presence of thermal effects

Abstract: Optimal design problems for semiconductor devices with relevant thermal effects can be formulated by help of the energy transport model. In this paper we perform a sensitivity analysis to derive the first‐order necessary condition for the optimization. Exploiting the special structure of the KKT system we use a special variant of the classical Gummel iteration to provide a very fast optimization algorithm. Numerical results for a ballistic diode underline the feasibility of our approach.

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Cited by 5 publications
(8 citation statements)
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“…Note, that the first variation ofb λ for v ∈ Σ is in fact the weak formulation of nonlinear Poisson equation (P λ ) (cf. (11)).…”
Section: The Nonlocal Nonlinear Poisson Problemmentioning
confidence: 99%
See 2 more Smart Citations
“…Note, that the first variation ofb λ for v ∈ Σ is in fact the weak formulation of nonlinear Poisson equation (P λ ) (cf. (11)).…”
Section: The Nonlocal Nonlinear Poisson Problemmentioning
confidence: 99%
“…Lemma 3.6. The mapping e λ as defined in (11) is Frchet differentiable. The actions of the derivative at a point (V, u) ∈ Σ × Y in a direction h ∈ H 1 (Ω) are given by…”
Section: Derivation Of the First-order Optimality Systemmentioning
confidence: 99%
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“…This is particularly important in reliability studies and when trying to predict the survival of these systems in space. Finally, much work had been done by the authors and others which include experimental and/or theoretical data on temperature and radiation effects in semiconductors [3][4][5][6][7][8]. So, the present paper is a trial to shed further light on such very interest and important field.…”
Section: Introductionmentioning
confidence: 99%
“…So far, the mathematical semiconductor design has focussed on classical macroscopic semiconductor model hierarchy, i.e., the stationary drift-diffusion equations [5,12,14], as well as on the energy transport model [8,9]. These macroscopic models, in combination with modern optimization algorithms, proved to be a reliable tool for the optimal design of semiconductor doping profiles.…”
Section: Introductionmentioning
confidence: 99%