In this study, HfO2-based
multilayer spectrally selective
emitters embedded with VO2 nanoparticles were designed
and their spectral performance was analyzed. To verify the thermal
stability of the designed emitters, in situ X-ray diffraction (XRD)
was performed on the VO2 nanoparticles and the HfO2 film. The figure of merit (FOM), spectral selectivity efficiency
(η
s), and spectral cutoff efficiency
(η
c) were first adopted as the evaluation
criteria, and an in-depth analysis of their relationship was conducted.
Meanwhile, an ideal thermophotovoltaic (TPV) system was built to evaluate
the spectral performance of the emitters that met the evaluation criteria
requirements. Furthermore, the mechanism of the spectral selectivity
of the proposed emitter was investigated. The in situ XRD results
show that both the VO2 nanoparticles and HfO2 film can maintain thermal stability below 1300 K. The FOM is focused
on the output energy of the emitter in the convertible waveband, while
ηs and ηc are aimed at evaluating
the energy conversion efficiency of the emitter. The emitters with
maximum FOM, ηs, and ηc show good
performance in the TPV system. A trilayer emitter with a 100 nm embedded
layer sandwiched by 10 nm HfO2 films can provide the TPV
system with the highest conversion efficiency (13.4%) through the
design process. The total thicknesses of the structures with good
spectral performance are concentrated in the range of 90–165
nm. The structures can have good spectral performance in terms of
their spectral emittance in the convertible waveband, which can be
enhanced due to the influence of scattering of the nanoparticles.
This study can provide guidelines for the development of a spectrally
selective emitter with high thermal stability.