Semi-empirical parameters for electronic stopping force model. Relative differences between experimental data and various stopping models (this model, SRIM2013, DPASS)

Ludeke, Sascha; Javanainen, Arto

doi:10.17011/jyx/dataset/78898

Cited by 1 publication

(4 citation statements)

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“…3 shows that the model accurately describes the LET values for protons in Si, which is of importance for the method proposed in this work, Table I, Fig. 4 as well as the data published at [28] further show that the LET model on its own can be successfully applied to a wider variety of projectile-target combinations, including heavy ion projectiles.…”

Section: B Resultssupporting

confidence: 54%

“…For H projectiles in Si targets the value for p 0 is 0.774 and 1.231 for p 1 . The p 0 and p 1 parameters for the remaining data sets are published at [28]. Furthermore an example of the heavy ion LET values is given for O projectiles in an Al target is given in Fig.…”

Section: B Resultsmentioning

confidence: 99%

“…regards to every individual experimental value used in the fitting procedure has been published at [28].…”

Section: B Resultsmentioning

confidence: 99%

“…For projectiletarget combinations not covered in this step, the values can be determined via linear interpolation of p 0 and p 1 over Z 1 and Z 2 . The p 0 and p 1 parameters for all fitted data sets have been published at [28].…”

Section: A Model and Calculationsmentioning

confidence: 99%

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Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction

Ludeke

Javanainen

2022

IEEE Trans. Nucl. Sci.

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This work introduces a numerical method to iteratively extract parameters of a rectangular parallelepiped (RPP) sensitive volume (SV) from experimental proton direct ionization SEU data. The method combines two separate numerical models. The first model estimates the average LET values for energetic ions, including protons and also heavy ions, in elemental solid targets. The second model describes the statistical variance in the energy deposition events of projectile-induced primary ionization within a RPP shaped target volume. To benchmark the method, simulated cross-section values based on RPP parameters derived with this method are compared with literature data from four SRAM devices. The RPP geometries determined by this method reproduced the experimental crosssection values in the literature with good accuracy, therefore showing that this method can be used to reliably and quickly determine the RPP parameters for SVs in memories sensitive to proton direct ionization (PDI). The method is currently strictly limited to direct ionization effects, i.e. not taking into account any nuclear reaction mechanisms, and elemental materials due to the underlying models' definitions.Index Terms-proton direct ionization (PDI), single event upset (SEU), linear energy transfer (LET), straggling, Monte Carlo (MC) method, rectangular parallelepiped (RPP)

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Section: B Resultssupporting

confidence: 54%

Section: B Resultsmentioning

confidence: 99%

“…regards to every individual experimental value used in the fitting procedure has been published at [28].…”

Section: B Resultsmentioning

confidence: 99%

Section: A Model and Calculationsmentioning

confidence: 99%

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