1977
DOI: 10.1007/bf02642867
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SEM observations of dislocation substructures around fatigue cracks in aisi type 304 stainless steel

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1979
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Cited by 11 publications
(4 citation statements)
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“…One sequence of operations ofthis type is usually sufficient to identify all the subgrains in a given area. The cell sizes deduced in this technique agree well with those found by more conventional TEM techniques (De Vries and Mastenbrock 1977;Schmidt et al 1978) although they are obtained much more quickly and from a wider area of the specimen than is possible in the TEM case. The minimum misorientation between cells can be estimated by noting the minimum change in angle of incidence that is needed to make any individual cell visible.…”
Section: R94supporting
confidence: 63%
“…One sequence of operations ofthis type is usually sufficient to identify all the subgrains in a given area. The cell sizes deduced in this technique agree well with those found by more conventional TEM techniques (De Vries and Mastenbrock 1977;Schmidt et al 1978) although they are obtained much more quickly and from a wider area of the specimen than is possible in the TEM case. The minimum misorientation between cells can be estimated by noting the minimum change in angle of incidence that is needed to make any individual cell visible.…”
Section: R94supporting
confidence: 63%
“…The presence of the subsurface zone (SZ), physical properties of which differ from those in the interior of a material [1] may influence the performance of the surface in service. For inspection of such alternations profilometry, microscopy, hardness testing, SEM, TEM [2] X-ray diffraction can be used [3,4]. Positron annihilation spectroscopy is seldom used for this purpose; however; it is a widely used technique for detecting of the defects at the atomic scale [5][6][7][8].…”
Section: Introductionmentioning
confidence: 99%
“…The most studied materials exposed to sandblasting are dental alloys [ 1 ], stainless steels [ 3 ], titanium [ 4 ], and titanium alloys [ 5 ]. Scanning electron microscopy (SEM), atomic force microcopy (AFM), X-ray diffraction (XRD), or microhardness measurements are commonly used to investigate the morphology of sandblasted surfaces or properties of the nanocrystallized subsurface regions [ 6 , 7 ]. Studies revealed that sandblasted surfaces are sensitive to the stream pressure, size, and chemical composition of the applied particles.…”
Section: Introductionmentioning
confidence: 99%