Self‐Organized Hexagonal Patterns of Independent Magnetic Nanodots

Bobek, T.; Mikuszeit, N.; Camarero, Julio; Kyrsta, Stepan; Yang, Lin; Niño, Miguel Ángel; Höfer, Christian; Gridneva, Lidia; Arvanitis, D.; Miranda, Rodolfo; Miguel, J. J. de; Teichert, Christian; Kurz, H.

doi:10.1002/adma.200701163

Cited by 34 publications

(22 citation statements)

References 37 publications

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“…Metals [2], semiconductors [3][4][5][6], and insulators [7,8]. Out of these, nano-patterned semiconductor surfaces have started finding importance for applications in photonics and nanoscale magnetism [9,10].…”

Section: Introductionmentioning

confidence: 99%

Unusual pattern formation on Si(100) due to low energy ion bombardment

Basu

Mohanty

Som

2012

Applied Surface Science

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In this paper evolution of silicon surface topography, under low energy ion bombardment, is investigated at higher oblique incident angles in the range of 63⁰-83⁰. Si(100) substrates were exposed to 500 eV argon ions. Different surface morphology evolves with increasing angle of incidence. Parallel-mode ripples are observed up to 67⁰ which undergo a transition to perpendicular-mode ripples at 80⁰. However, this transition is not a sharp one but undergoes a series of unusual pattern formation at intermediate angles. Complete smoothening of silicon surface is observed at incident angles beyond 80⁰. The observed patterns are attributed to surface confined viscous flow and sputter erosion under ion bombardment.

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Section: Introductionmentioning

confidence: 99%

Unusual pattern formation on Si(100) due to low energy ion bombardment

Basu

Mohanty

Som

2012

Applied Surface Science

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“…The proof of concept for simultaneous acquisition of the two in-plane components for a given field direction has been provided with our study of orthogonally coupled ferromagnetic films, 16 which we extended to include an automated v-MOKE setup to perform whole angular studies. 6,[17][18][19][20][21][22] Other groups have recently implemented similar setup. 23 Our studies have been focused on ferromagnetic (FM) and antiferromagnetic (AFM) materials with different magnetic anisotropy strengths and configurations.…”

Section: B B B B B B B B B B B B B B B B B B B B B B Bmentioning

confidence: 99%

“…23 Our studies have been focused on ferromagnetic (FM) and antiferromagnetic (AFM) materials with different magnetic anisotropy strengths and configurations. These include randomly oriented magnetic nanostructures, 17 single FM thin films with well-defined uniaxial anisotropy, 18,22 and competitive anisotropies. 19,24 Exchange-biased FM/AFM systems with collinear 6 and non-collinear 20,21,25 anisotropy configurations and exchange-biased spin valve structures 26 have also been investigated systematically with the setup.…”

Section: B B B B B B B B B B B B B B B B B B B B B B Bmentioning

confidence: 99%

Vectorial Kerr magnetometer for simultaneous and quantitative measurements of the in-plane magnetization components

Jiménez

Mikuszeit

Cuñado

et al. 2014

Review of Scientific Instruments

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A vectorial magneto-optic Kerr effect (v-MOKE) setup with simultaneous and quantitative determination of the two in-plane magnetization components is described. The setup provides both polarization rotations and reflectivity changes at the same time for a given sample orientation with respect to a variable external magnetic field, as well as allowing full angular studies. A classical description based on the Jones formalism is used to calculate the setup's properties. The use of different incoming light polarizations and/or MOKE geometries, as well as the errors due to misalignment and solutions are discussed. To illustrate the capabilities of the setup a detailed study of a model four-fold anisotropy system is presented. Among others, the setup allows to study the angular dependence of the hysteresis phenomena, remanences, critical fields, and magnetization reversal processes, as well as the accurate determination of the easy and hard magnetization directions, domain wall orientations, and magnetic anisotropies.

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“…The interaction of solid with energetic ion beams has been widely utilized to grow self-organized nanostructures such as nanoscale ripple, 1 nanodots, 2 pits, 3 and voids. 4 The fabrication of nanodots like structures and their physical properties are topics of more recent interest due to their potential applications in optoelectronics devices. 5 In spite of high interest in the subject, the accessible methods for the fabrication of such dots are quite limited.…”

Section: Introductionmentioning

confidence: 99%

Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces

Maity

Ojha

Sulania

et al. 2019

Surface & Interface Analysis

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The fractal characterizations of amorphized‐silicon (a‐Si) surfaces under low‐energy ion irradiations are presented. The crystalline Si surfaces have been irradiated with Si ions having different energy of 35, 50, 75, and 100 keV at a fixed fluence of 2 × 1015 ions‐cm−2. The samples have been characterized by means of using Raman spectroscopy, Channeling‐Rutherford backscattering spectrometry (C‐RBS), and atomic force microscopy (AFM) techniques. The ion irradiation leads to the amorphization of Si near surface and subsurface region, as confirmed by Raman and C‐RBS measurement. The AFM analysis shows that the ion irradiation also leads to the formation of nanodots on the surface and size of the dots increases with increasing of the ion energy. The fractal analysis has been performed using AFM images in order to get the significant evidence about nanodot formations and the correlation inside the surface microstructures. The kinetic roughening and surface smoothening, due to dissipation of kinetic energy of ions through collision cascades of the surface atoms, lead to the formation of dot‐like structures.

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Self‐Organized Hexagonal Patterns of Independent Magnetic Nanodots

Cited by 34 publications

References 37 publications

Unusual pattern formation on Si(100) due to low energy ion bombardment

Unusual pattern formation on Si(100) due to low energy ion bombardment

Vectorial Kerr magnetometer for simultaneous and quantitative measurements of the in-plane magnetization components

Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces

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