2018
DOI: 10.1021/acs.jpcc.8b09793
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Self-Modulating Interfacial Cation Migration Induced Threshold Switching in Bilayer Oxide Memristive Device

Abstract: A selector device based on threshold switching is a potential candidate for preventing leaky current from nearby units in cross-point memristor arrays during operation, which is required for low-cost operation and good reliability. A simple selector structure, i.e., Ag/HfO y /HfO x /Pt (AHHP), was constructed in this work. The device exhibits electroforming-free properties, a low threshold switching voltage of ∼0.28 V, a wide range of operating current from 1 nA to 300 μA, and an extremely sharp switching slop… Show more

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Cited by 16 publications
(16 citation statements)
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References 52 publications
(95 reference statements)
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“…2e–g ), the complete h-Hf 6 O CF is enclosed by the surrounding m-HfO 2 shell (region 4). Coincidentally, crystallization of the surrounding oxide after the formation of complete CFs has also been observed in cation-based memristors 31 , 46 . Therefore, we propose that the CFs of HfO 2 -based RS memristors are accompanied by a nonconductive crystallization region, which has been generally ignored in previous studies on the mechanism of RS memristors.…”
Section: Resultsmentioning
confidence: 81%
“…2e–g ), the complete h-Hf 6 O CF is enclosed by the surrounding m-HfO 2 shell (region 4). Coincidentally, crystallization of the surrounding oxide after the formation of complete CFs has also been observed in cation-based memristors 31 , 46 . Therefore, we propose that the CFs of HfO 2 -based RS memristors are accompanied by a nonconductive crystallization region, which has been generally ignored in previous studies on the mechanism of RS memristors.…”
Section: Resultsmentioning
confidence: 81%
“…Two of the most common structures, Ag/SiO 2 /Pt (ASP) and Ag/HfO 2 /Pt (AHP) were fabricated by magnetron sputtering at room temperature without breaking the chamber vacuum. [ 33 ] The two‐terminal ASP and AHP memristors are measured based on a semi‐conductor analyzer probe station. For basic direct current (DC), I–V measurements, an external bias is applied to the Ag top electrodes (TE) and the Pt bottom electrodes (BE) are grounded.…”
Section: Electrodesmentioning
confidence: 99%
“…[60,61,101,[107][108][109][110] The Schottky diode maintains the OFF state in the cutoff region, therefore, it is only used for unipolar memristive devices. [111] Devices based on multilayer oxide/nitride junctions show the gradually varying I-V curve with high nonlinearity, mitigating the sneak path current. [112] The nonlinearity is also realized with the abruptly varied I-V curve based on MIT or TS.…”
Section: Crossbar Arraymentioning
confidence: 99%