Self-images of periodic phase elements in the fractional Fourier transform domain

Abstract

General conditions of periodic phase elements self-images forming (Talbot effect) in the fractional Fourier transform (FrFT) domain is given. Analytical solution of the FrFT images intensity distribution for the different forms (binary, linear, parabolic and others) of periodic elements low-level cell profiles is presented. Intensity difference I ∆ measuring of the FrFT periodic self-image allow to determine the phase difference ϕ ∆ of periodic elements low-level cell profile.