1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345)
DOI: 10.1109/soi.1999.819846
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'Self-body-biased' SOI MOSFET through 'depletion isolation effect'

Abstract: In its 'ON' state its body potential is electrically isolated from the external body terminal by the gate depletion layer, and is controlled automatically through the drain current and drain voltage. More than 30 % improvement in current drivability is predicted.

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Cited by 3 publications
(4 citation statements)
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“…In addition to the functionality of M4, those of M1 through M3 are the same as those previously reported. 3) In the linear response operation the V th of M1 determines the reset voltage of the photodiode; M2 is a source follower amplifier; M3 functions as a data selector. The V th of M1 and the V th and/or I d of M2 are the major origins of FPN of APS circuits.…”
Section: Basic Concepts Of Proposed Aps Cellmentioning
confidence: 99%
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“…In addition to the functionality of M4, those of M1 through M3 are the same as those previously reported. 3) In the linear response operation the V th of M1 determines the reset voltage of the photodiode; M2 is a source follower amplifier; M3 functions as a data selector. The V th of M1 and the V th and/or I d of M2 are the major origins of FPN of APS circuits.…”
Section: Basic Concepts Of Proposed Aps Cellmentioning
confidence: 99%
“…1,2) The FPN can be suppressed using the commonly used correlated double sampling (CDS) technique in CMOS APS array devices, but additional external circuitry is required. 1,2) One of the authors proposed a novel APS with reduced FPN utilizing dynamic threshold MOSFETs (DTMOSs) and demonstrated the possibility of FPN reduction 3) using a DTMOS with an inherently suppressed threshold voltage and/or drain conductance fluctuation 4) compared with a bulk counterpart without using the CDS technique.…”
Section: Introductionmentioning
confidence: 99%
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“…One of the candidate device structures for such applications is the ''selfbody-biased'' (''SBB'') silicon-on-insulator (SOI) metaloxide-semiconductor field-effect transistor (MOSFET), which utilizes the expansion of the gate depletion layer beneath the auxiliary ''T-shaped'' gate electrode in order to modulate the body potential, thus enhancing its current drivability in the ''ON'' state. [1][2][3] By further modifying the gate electrode shape, the author has already proposed the ''SBB'' static random access memory (SRAM) cell operating at 0.5 V. 4,5) However this ''SBB'' SRAM cell has limited layout flexibility because it inevitably requires the ''Hshaped'' gate electrodes for realizing the cross-coupled inverter pair of the SRAM cell.…”
mentioning
confidence: 99%