Self-assembled stoichiometric barium titanate thin films grown by molecular beam epitaxy

Morgan, Timothy A.; Zamani-Alavijeh, Mohammad; Erickson, Stephen; Story, Grzegorz; Schroeder, W. C.; Kuchuk, Andrian; Benamara, Mourad; Salamo, Gregory J.

doi:10.1016/j.jcrysgro.2018.04.023

Cited by 3 publications

(1 citation statement)

References 22 publications

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“…The experimental measurements were made on ferroelectric barium titanate (BTO) ultrathin films (2, 10, and 40 nm), grown by molecular beam epitaxy (MBE) 29 , on strontium titanate doped with niobium (STOp0.05% Nb)). BTO can have dipoles aligned along any one of three perpendicular crystal directions, [001], [010], or…”

Section: Measurementmentioning

confidence: 99%

Polarization Domain Dynamics of Barium Titanate Ultrathin Films Using Piezoresponse Force Microscopy.

Salamo

Zamani-Alavijeh

Morgan

et al. 2021

Preprint

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Piezoresponse force microscopy is used to study the velocity of the polarization domain wall in ultrathin ferroelectric barium titanate films grown on strontium titanate substrates by molecular beam epitaxy. The electric field due to the cone of the atomic force microscope tip is proposed as the dominant electric field of the tip in thin films for domain expansion at lateral distances greater than about one tip diameter away from the tip. The velocity of the domain wall under the applied electric field by the tip in barium titanate for thin films (less than 40 nm) followed an expanding process given by Merz’s law. The material constants in a fit of the data to Merz’s law for very thin films are reported as about 4.2 KV/cm for activation field, Ea, and 0.05 nm/s for limiting velocity, v∞. These material constants showed a dependence on the level of strain in the films but no fundamental dependence on thickness.

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Section: Measurementmentioning

confidence: 99%

Polarization Domain Dynamics of Barium Titanate Ultrathin Films Using Piezoresponse Force Microscopy.

Salamo

Zamani-Alavijeh

Morgan

et al. 2021

Preprint

View full text Add to dashboard Cite

show abstract

Fermi energy, electrical conductivity, and the energy gap of NaNbO3

Bein

Kmet

Rojac

et al. 2022

Phys. Rev. Materials

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The Growth of Polarization Domains in Ultrathin Ferroelectric Films Seeded by the Tip of an Atomic Force Microscope

et al. 2022

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Piezoresponse force microscopy is used to study the velocity of the polarization domain wall in ultrathin ferroelectric barium titanate (BTO) films grown on strontium titanate (STO) substrates by molecular beam epitaxy. The electric field due to the cone of the atomic force microscope tip is demonstrated as the dominant electric field for domain expansion in thin films at lateral distances greater than about one tip diameter away from the tip. The velocity of the domain wall under the applied electric field by the tip in BTO for thin films (less than 40 nm) followed an expanding process given by Merz’s law. The material constants in a fit of the data to Merz’s law for very thin films are reported as about 4.2 KV/cm for the activation field, $$E_{\mathrm{a}}$$ E a , and 0.05 nm/s for the limiting velocity, $$v_{\infty }$$ v ∞ . These material constants showed a dependence on the level of strain in the films, but no fundamental dependence on thickness.

show abstract

Self-assembled stoichiometric barium titanate thin films grown by molecular beam epitaxy

Cited by 3 publications

References 22 publications

Polarization Domain Dynamics of Barium Titanate Ultrathin Films Using Piezoresponse Force Microscopy.

Polarization Domain Dynamics of Barium Titanate Ultrathin Films Using Piezoresponse Force Microscopy.

Fermi energy, electrical conductivity, and the energy gap of NaNbO3

The Growth of Polarization Domains in Ultrathin Ferroelectric Films Seeded by the Tip of an Atomic Force Microscope

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