Advances in X-Ray Analysis 1975
DOI: 10.1007/978-1-4613-9978-0_50
|View full text |Cite
|
Sign up to set email alerts
|

Self Absorption Corrections for X-Ray Fluorescence Analysis of Aerosols

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
11
0

Year Published

1975
1975
2015
2015

Publication Types

Select...
6
2
1

Relationship

0
9

Authors

Journals

citations
Cited by 22 publications
(11 citation statements)
references
References 8 publications
0
11
0
Order By: Relevance
“…Trace elements by EDXRF are mostly in the range from 25% to 40%. Light elements analyzed by EDXRF, such as sodium and aluminum, show relatively poor precision compared with heavier elements due to selfabsorption as described previously (see, e.g., Dzubay and Nelson, 1975;Berry et al, 1969).…”
Section: Precision Based On Colocated Datamentioning
confidence: 76%
See 1 more Smart Citation
“…Trace elements by EDXRF are mostly in the range from 25% to 40%. Light elements analyzed by EDXRF, such as sodium and aluminum, show relatively poor precision compared with heavier elements due to selfabsorption as described previously (see, e.g., Dzubay and Nelson, 1975;Berry et al, 1969).…”
Section: Precision Based On Colocated Datamentioning
confidence: 76%
“…Selfabsorption corrections for IMPROVE were applied to the EDXRF data prior to 2011 (Dzubay and Nelson, 1975;IMPROVE, 1997). A homogeneously distributed sample deposit on the filter is assumed, as well as incorporating particle-size and mass loading effects.…”
Section: Carbonmentioning
confidence: 99%
“…An electron from an outer shell fills the hole, leading to 400 the emission of a fluorescent X-ray of well-defined energy (Figure 1) particles must be deposited as a uniform layer or film. Second, the thickness of the film must 421 be thin relative to both the penetration depth of the primary X-ray and the depth from which 422 the fluorescent X-rays emerge (Bertin, 1975;Criss, 1976;Dzubay and Nelson, 1975). ED-…”
mentioning
confidence: 99%
“…152 A particle size correction factor has also been tested for XRF analysis of filter-deposited particulate samples. 153 Self-absorption corrections for XRF analysis of ambient air samples can be made according to a developed procedure 154 and tabulated parameters for x-ray emission, absorption, and scattering can be used to predict the absolute line intensity and background scattering from pollution samples. 155 By application of energy dispersive XRF, the metals Fe, Zn, and Pb were found in urban air samples over a range of 10-1000 ng/m 3 .…”
Section: Other Instrumental Methodsmentioning
confidence: 99%