TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference 2009
DOI: 10.1109/sensor.2009.5285710
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Selective removal of micro-corrugation by anisotropic wet etching

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Cited by 3 publications
(3 citation statements)
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“…As discussed in the next paragraph, one source of strength decay is the stress concentration factor, which holds in those zones where surface discontinuities appear. In high aspect ratio DRIE Bosch process, problems and challenges regarding scalloping attenuation have been reported in various investigations [35][36][37][38][39][40], although the problem presented several difficulties.…”
Section: Introductionmentioning
confidence: 99%
“…As discussed in the next paragraph, one source of strength decay is the stress concentration factor, which holds in those zones where surface discontinuities appear. In high aspect ratio DRIE Bosch process, problems and challenges regarding scalloping attenuation have been reported in various investigations [35][36][37][38][39][40], although the problem presented several difficulties.…”
Section: Introductionmentioning
confidence: 99%
“…Isotropic etching, due to its uniform etching rate along all directions, is not suitable for removing corrugations on dry-etched vertical sidewalls. Wet anisotropic etching is also used for corrugation removal [24][25][26]. Sasaki et al used a wet etching process after DRIE to reduce the corrugation [24].…”
Section: Introductionmentioning
confidence: 99%
“…Yun et al fabricated the vertical optical plane of {1 1 1} Si using DRIE and 45 wt% KOH at 70 • C [25]. Shikida et al analyzed the corrugation removal mechanism by using the anisotropic etch rates in KOH [26]. They succeeded to remove microcorrugation by short-time (5 min) etching in 50 wt% KOH.…”
Section: Introductionmentioning
confidence: 99%