2021
DOI: 10.1016/j.nanoen.2020.105451
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Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam

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Cited by 18 publications
(13 citation statements)
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“…To this end, energy band characterizations have been further performed. (4.5 mV), [36] heterojunction construction (58 mV), [38] thickness engineering (25 mV) [39] as well as defect engineering (65-70 mV), [40,41] and it is comparable to that of phase engineering (103 mV) [42] and smaller than that of charge transfer doping (169 mV). [43] However, it is to be emphasized that phase engineering suffers from poor thermal and long-term stability due to the relatively small relaxation energy for the transition from metastable phase to thermodynamical phase.…”
Section: Resultsmentioning
confidence: 94%
“…To this end, energy band characterizations have been further performed. (4.5 mV), [36] heterojunction construction (58 mV), [38] thickness engineering (25 mV) [39] as well as defect engineering (65-70 mV), [40,41] and it is comparable to that of phase engineering (103 mV) [42] and smaller than that of charge transfer doping (169 mV). [43] However, it is to be emphasized that phase engineering suffers from poor thermal and long-term stability due to the relatively small relaxation energy for the transition from metastable phase to thermodynamical phase.…”
Section: Resultsmentioning
confidence: 94%
“…The regions with He ion doses below 10 16 ions/cm 2 show a slight decrease in the effective d 33 . This decrease may be due to the defect formation by ion bombardment or the carbon contamination at the surface of the HZO thin film after ion bombardment (32)(33)(34). When the He ion dose is increased to 5 ×10 16 ions/cm 2 or more, the effective d 33 is substantially increased compared with that of the pristine region.…”
Section: Piezoresponse-dependent Light Ion Bombardmentmentioning
confidence: 99%
“…This reduction may result from the defect formation by ion bombardment. However, it may be also associated with carbon contamination at the surface because carbon deposition can be easily induced by the surface adsorbates of hydrocarbon molecules during ion bombardment ( 32 34 ) and, furthermore, the atomic force microscopy (AFM) measurements can be sensitive to carbon contamination. However, the regions with He ion doses above 10 16 ions/cm 2 show an increase in the R-PFM amplitude with an increase in the He ion dose.…”
Section: Piezoresponse-dependent Light Ion Bombardmentmentioning
confidence: 99%
“…For example, pinning of ferroelectric domains in PbZr 0.2 Ti 0.8 O 3 thin films at doses of 0.22 × 10 15 to 1 × 10 15 ions/cm 2 has been demonstrated, and through site-selective direct-write patterning with variable dose, various nanostructures with novel ferroelectric-switching functionalities have been fabricated [ 33 ] ( Figure 2f ). Using similar doses, out-of-plane piezoelectricity has been patterned into multilayered MoTe 2 [ 56 ]. In the case of helium ion irradiation of a bulk van der Waals layered ferroelectric semiconductor crystal (CuInP 2 S 6 ), local volume expansion due to helium ion implantation was observed, forming a conical surface topography within which for increasing dose the ferroelectric domains were gradually destroyed [ 57 ].…”
Section: Reviewmentioning
confidence: 99%