2000
DOI: 10.1143/jjap.39.5914
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Selective Disordering of InGaAs Strained Quantum Well by Rapid Thermal Annealing with SiO2 Caps of Different Thicknesses for Photonic Integration

Abstract: Area-selective disordering of an InGaAs strained quantum well was performed by rapid thermal annealing with thick and thin SiO2 caps. The lasing wavelength difference as large as 23 nm was obtained between Fabry-Perot lasers in 300 nm and 30 nm capped areas. We present fabrication of lasers integrated with disordered passive waveguides and demonstrate significant reduction of the passive waveguide loss from roughly 40 cm-1 to 3 cm-1.

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Cited by 10 publications
(6 citation statements)
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“…By using selective area QW disordering, the absorption loss in the DBR grating region can be significantly reduced to ¼ 3 cm À1 . 4) The dependence of the DBR reflectivity R DBR and the wavelength bandwidth Á! on the coupling coefficient was calculated for L ¼ 200 mm and ¼ 3 cm À1 .…”
Section: Device Description and Designmentioning
confidence: 99%
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“…By using selective area QW disordering, the absorption loss in the DBR grating region can be significantly reduced to ¼ 3 cm À1 . 4) The dependence of the DBR reflectivity R DBR and the wavelength bandwidth Á! on the coupling coefficient was calculated for L ¼ 200 mm and ¼ 3 cm À1 .…”
Section: Device Description and Designmentioning
confidence: 99%
“…Selective area QW disordering was performed by rapid thermal annealing (RTA) using SiO 2 caps of different thicknesses. 4,5) SiO 2 caps of 300-nm and 30-nm thickness were deposited by plasma chemical vapor deposition for the disordering and suppressing caps, respectively. Then RTA was performed at 860 C for 60 s and the both SiO 2 caps were removed by buffer etching.…”
Section: Device Fabricationmentioning
confidence: 99%
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“…9 Rapid thermal annealing of InGaAs/GaAs quantum wells also results in a blue shift of the PL spectrum due to intermixing at the well-barrier interface. 12 In contrast, double crystal x-ray diffraction measurements made on a In 0.20 Ga 0.80 As/GaAs multiquantum well sample, grown by MBE and subjected to pulsed laser annealing, show no evidence of wellbarrier interdiffusion. Figure 2a and b shows the integrated PL intensity variation for pulse laser annealed and rapid thermal annealed InAs/GaAs quantum dots.…”
mentioning
confidence: 94%
“…From all of our IFVD results, blueshift is always observed. From the literature, bandgap blueshift with SiO 2 -capped IFVD is also reported by other researchers [7,11,106,133,[137][138]. This probably because: under the SiO 2 layer, the gallium atom of the top layer will out-diffuse into the cap layer and cation vacancies are generated, while the SiO 2 cap layer itself also contains certain amount of anion vacancies due to its porosity [138].…”
Section: Resultsmentioning
confidence: 52%