2012 38th IEEE Photovoltaic Specialists Conference 2012
DOI: 10.1109/pvsc.2012.6318018
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Selective and homo emitter junction formation using precise dopant concentration control by ion implantation and microwave, laser or furnace annealing techniques

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Cited by 3 publications
(3 citation statements)
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“…It is known that there are high dopant peak concentrations at the surface layer in the cell prepared by POCl 3 diffusion. 12) In this layer with high peak concentrations, there was electrically inactive phosphorus. 18) The surface recombination was increased and solar cell parameters deteriorated owing to the electrically inactive dopants.…”
Section: Conventional Structure Solar Cellsmentioning
confidence: 99%
See 1 more Smart Citation
“…It is known that there are high dopant peak concentrations at the surface layer in the cell prepared by POCl 3 diffusion. 12) In this layer with high peak concentrations, there was electrically inactive phosphorus. 18) The surface recombination was increased and solar cell parameters deteriorated owing to the electrically inactive dopants.…”
Section: Conventional Structure Solar Cellsmentioning
confidence: 99%
“…The junction depth of wafers formed with the ion shower doping technique was assumed to be approximately 500 nm. 12) We also fabricated selective emitter structure solar cells using the ion shower doping technique. First, we prepared a low-doping uniformity emitter layer by POCl 3 diffusion at 860 C for 20 min before we fabricated a selective highdoping emitter region.…”
Section: Solar Cell Fabricationmentioning
confidence: 99%
“…al. [36] in 2011 with implanted phosphorous and boron in silicon and under various annealing condition and techniques. Simulated results of this study showed greater than 20% efficiency is achievable using peak doping concentration of ~110 19 cm -3 and with junction depth of 400 -900 nm (Fig.…”
Section: P-n Junction Formationmentioning
confidence: 99%