2017
DOI: 10.1016/j.surfin.2017.09.003
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Selecting suitable image dimensions for scanning probe microscopy

Abstract: The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology-how to choose a scan size which is representative of the entire sample. The topographies of a v… Show more

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Cited by 4 publications
(3 citation statements)
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“…It was showed that the measured height of organic samples critically depend on pixel size, as the measured average sample height decreased and standard deviation increased with increasing pixel size [ 108 ]. It was demonstrated that increasing pixel size results in an increase in the apparent surface roughness, and therefore in larger sample height deviations [ 112 , 113 ]. Quite generally, it is clear that imaging at insufficient resolution will cause distortions in image and will lead to deviations or lateral and vertical dimension measurements.…”
Section: Resolution Sensitivity and Accuracy For Single Molecule Meamentioning
confidence: 99%
“…It was showed that the measured height of organic samples critically depend on pixel size, as the measured average sample height decreased and standard deviation increased with increasing pixel size [ 108 ]. It was demonstrated that increasing pixel size results in an increase in the apparent surface roughness, and therefore in larger sample height deviations [ 112 , 113 ]. Quite generally, it is clear that imaging at insufficient resolution will cause distortions in image and will lead to deviations or lateral and vertical dimension measurements.…”
Section: Resolution Sensitivity and Accuracy For Single Molecule Meamentioning
confidence: 99%
“…It is expected the films will exhibit a high degree of cross-linking, which gives these films their high modulus. This also leads to very smooth films [27] covered with fluorine atoms, thus exhibiting low adhesion and friction [7]. This low friction reduces the tensile stress surrounding the sharp tip, and in turn the yield zone, and should therefore reduce the amount of plastic flow damage [28].…”
Section: Abrasive Wear Tests Using Afmmentioning
confidence: 99%
“…The two famous core methods of surface scanning – AFM and NSOM – were developed separately in the 1980s, forty years later the trend is clearly to improve, combine, and adapt methods while reducing efforts and increasing accuracy. Invented in 1986 by IBM scientists 11 , and following its Scanning Tunneling Microscope (STM) predecessor 12 , 13 , the Atomic Force Microscopy (AFM) served for years as the Scanning Probe Microscopy (SPM) branch 14 , 15 core method 16 , mainly used for nanoscale surface topography characterization. On the other hand, the Near Field Scanning Optical Microscopy (NSOM) 17 , served in parallel as the sub-diffractive optical characterization core method 18 .…”
Section: Introductionmentioning
confidence: 99%