a b s t r a c tThe segregation of boron and its reactivity toward nitric oxide have been investigated by means of highresolution Auger spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), and thermal desorption spectroscopy (TDS). The segregation of boron from a Rh foil started from 700 K. Its presence altered the surface behaviors of Rh; the uptake of NO increased by about 30-37%. Whereas the dissociation of NO was about 3-10% on a clean, boron-free surface, the extent of dissociation (at saturation) at highest boron level was almost 98%. This feature strongly suggest a direct interaction between NO and boron on the surface. The presence of boron greatly stabilized the adsorbed nitrogen and oxygen formed in NO dissociation. Boron oxide (BO, B 2 O 2 ) sublimated from the surface below 1000 K. Clean, single BN layer formed on the surface close to a monolayer regime, presumable in nanomash structure.