SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures

Artola, L.; Ducret, S.; Advent, F.; Hubert, G.; Mekki, Julien

doi:10.1109/tns.2018.2880791

Cited by 5 publications

(2 citation statements)

References 21 publications

(23 reference statements)

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“…MUSCA SEP3 is a soft error prediction tool based on a Monte-Carlo approach which allows a complete simulation from the interactions of radiation particles with the matter to the occurrence of single event effects (SET, SEU) in the IC as shown in Figure 8 below. The complete principle of the modelling is reported in previous works [5,[9][10][11][12]. First, these simulations use GEANT4 databases (for nuclear, ionization, interactions .…”

Section: Single Event Effect Modelingmentioning

confidence: 99%

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Soft Error Simulation of Near-Threshold SRAM Design for Nanosatellite Applications

Artola,

Ruard,

Forest

et al. 2023

Electronics

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This paper presents the benefit of the near-threshold design of random-access memory (SRAM) design to reduce software errors during very low-power operations in nanosatellites. The near-threshold design is based on an optimization of the use of the Schmitt trigger structure for a 45 nm technology. The results of the soft error susceptibility of the optimized design are compared to a standard 6T SRAM cell. These two designs are modeled and validated by comparing the results with experimental measurements of both static noise margin (SNM) and single event upset (SEU). The optimized circuit reduces the multiple upsets occurrence from 95% down to 14%. Based on the use of simulation tools, the paper demonstrates that the near-threshold design of SRAM is an excellent candidate for the radiation point of view for agile nanosatellites. The results computed for the near-threshold SRAM device demonstrate an improvement of a factor of up to 25 of the soft error rate (SER) in a GEO orbit.

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Section: Single Event Effect Modelingmentioning

confidence: 99%

“…The complete principle of the modelling is reported in previous works [5,[9][10][11][12]. First, these simulations use GEANT4 databases (for nuclear, ionization, interactions …) in order to describe the deposition of free carriers by the radiation particle.…”

Section: Validation Of Seu Prediction With Heavy Ion Test Datamentioning

confidence: 99%