SEE test results on a commercially designed and manufactured NOR FLASH

Jordan, A.; Farris, T.; Hafer, C.; Thun, Matthew Von; Benedetto, Joanne M.

doi:10.1109/radecs.2011.6131337

2011 12th European Conference on Radiation and Its Effects on Components and Systems 2011

DOI: 10.1109/radecs.2011.6131337

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SEE test results on a commercially designed and manufactured NOR FLASH

A. Jordan

T. Farris

C. Hafer

et al.

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SEE test results on a commercially designed and manufactured NOR FLASH

Cited by 1 publication

References 0 publications

Analysis of Ion-Induced SEFI and SEL Phenomena in 90 nm NOR Flash Memory

Analysis of Ion-Induced SEFI and SEL Phenomena in 90 nm NOR Flash Memory

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