SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

Abstract

This paper explains the inconsistencies reported between effective flux calculations and integral rectangular parallelepiped calculations. The two types of calculation yield consistent results when the effective flux calculation is performed allowing for the appropriate geometry. A set of generic heavy ion cross section curves is introduced so that upset rate calculations can be compared as a function of device area and threshold.The figure of merit approximation is generalized so that it can be used for any orbit

CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code

“…Although the GCR model in CREME96 gives a much improved description of the solar cycle variation in GCR intensity, Figure 2 suggests that changes in the solar minimum environment per se are relatively small. This is confirmed in Figure 3, which shows calculated SEU rates3 behind 100 mils A1 shielding in geosynchronous orbit for a set of representative devices [13]. These devices were chosen to represent a wide range of thresholds, device dimensions, and technologies.…”

“…To demonstrate this, Figure 5 shows SEU rates behind 100 mils A1 shielding in 28.5O, 450 km orbit for the set of representative devices [13]. In low-threshold devices, where relativistic Galactic cosmic rays dominate, the SEU rates are unchanged.…”

Radiation Effects in Si CMOS Platforms

“…The RPP method is also available in the commercial software packages, NOVICE [19] and Space Radiation [20]. This modified FoM is presented in other and perhaps more convenient forms in [29]. In [111] Petersen discusses its applicability to many practical situations.…”

“…Also see [28], [29], [88], [120], [121], [123], [124], [125], [126] and [128] 3.6 Proton-and Neutron-Induced SEEs…”

“…The need for a revision of CRÈME also stimulated the development of the CHIME (CRRES/SPACERAD Heavy Ion Model of the Environment) [26] and MACREE (Modeling and Analysis of Cosmic Ray Effects in Electronics) [27]. The Single Event Figure of Merit method was also revised to use the solar minimum galactic cosmic ray spectrum [28] and extended to circular orbits down to 200 km at any inclination [29]. More recently a series of commercial codes was developed by TRAD (Test & Radiations) which includes the OMERE code [30] which calculates single event effects.…”