SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed-Field Facilities

Cecchetto, Matteo; Fernández-Martínez, P.; Alía, Rubén García; Ferraro, Rudy; Danzeca, Salvatore; Wrobel, Frédéric; Cazzaniga, Carlo; Frost, Christopher

doi:10.1109/tns.2019.2908067

Cited by 15 publications

(26 citation statements)

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The respective references are AS7C34098A-10TCN (200 nm) for Alliance and K6R4016V1D-TC10 (180 nm) for Samsung, both with 4 Mbit of memory. They were tested against SEL in Reference [2] and [15]. In the ChipIr spallation facility, the SEL cross section resulted in 7.1×10 -11 cm 2 /dev and 6.8×10 -11 cm 2 /dev for Alliance and Samsung, respectively [2].…”

Section: See Calculation and Resultsmentioning

confidence: 99%

“…The H10% values spread up to almost 1800 MeV (Table 1), which are also typical in accelerator environments. For comparison, the ChipIr spallation facility provides the hardness of 283 MeV [2].…”

Section: Atmospheric Radiation Environmentsmentioning

confidence: 99%

“…Fluxes for the SEE estimation are generally considered above 10 MeV, as the SEE cross sections of most electronics are sensitive above this threshold. However, with technology scaling and for sizes below 150 nm, more and more devices are sensitive to intermediate energy neutrons, even above 1 MeV [2,3] and therefore the 10 MeV limit for flux and component characterization may need to be shifted down to 1 MeV [4]. According to Reference [1], a neutron flux above 10 MeV at ground level (New York City) results in 20 neutrons/(cm 2 /h), 300 times lower than that at 12 km, although it is reported as 450 times lower (13 neutrons/(cm 2 /h)) in Reference [5].…”

Section: Introductionmentioning

confidence: 99%

“…FLUKA is a Monte Carlo tool [9,16] for studying the interactions of particles and matter. The model is employed to calculate the deposited energy inside the memory's sensitive volume needed to trigger an SEE, and it has been validated for protons [13] and neutrons [2]. It requires input of the following information: -The geometrical parameters of the memory structure.…”

mentioning

confidence: 99%

“…If the feature size is below 150 nm, the contribution of neutrons between 1-10 MeV should also be included using a flux of 9200 neutrons/cm 2 /h. It is worth noting that this simplified approach for avionics is very similar to that used in accelerator environments, which consists of multiply the 200 MeV SEE cross section by the HEH flux of interest [2,18].…”

mentioning

confidence: 99%

See 4 more Smart Citations

Impact of Energy Dependence on Ground Level and Avionic SEE Rate Prediction When Applying Standard Test Procedures

2019

Self Cite

View full text Add to dashboard Cite

Single event effects (SEEs) in ground level and avionic applications are mainly induced by neutrons and protons, of which the relative contribution of the latter is larger with increasing altitude. Currently, there are two main applicable standards—JEDEC JESD89A for ground level and IEC 62396 for avionics—that address the procedure for testing and qualifying electronics for these environments. In this work, we extracted terrestrial spectra at different altitudes from simulations and compared them with data available from the standards. Second, we computed the SEE rate using different approaches for three static random access memory (SRAM) types, which present a strong SEE response dependence with energy. Due to the presence of tungsten, a fissile material when interacting with high energy hadrons, the neutron and proton SEE cross sections do not saturate after 200 MeV, but still increase up to several GeV. For these memories, we found standard procedures could underestimate the SEE rate by a factor of up to 4-even in ground level applications—and up to 12 times at 12 km. Moreover, for such memories, the contribution from high energy protons is able to play a significant role, comparable to that of neutrons, even at commercial flight altitudes, and greater at higher altitudes.

show abstract

Section: See Calculation and Resultsmentioning

confidence: 99%

Section: Atmospheric Radiation Environmentsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

See 3 more Smart Citations

Impact of Energy Dependence on Ground Level and Avionic SEE Rate Prediction When Applying Standard Test Procedures

2019

Self Cite

View full text Add to dashboard Cite

show abstract

Influence of 0.1–10 MeV neutron-induced SEUs on estimation of terrestrial SER in a nano-scale SRAM

Qi,

Bai,

Jin

et al. 2023

AIP Advances

View full text Add to dashboard Cite

The impact of 0.1–10 MeV neutron-induced single-event upsets (NSEUs) on terrestrial SER (soft error rate) prediction is analyzed for several broad spectrum neutron sources based on 0.1–200 MeV NSEU energetic-dependent cross-sectional data of a 40 nm SRAM. The results show that for test facilities with abundant <10 MeV neutrons, such as ISIS ChipIR, J-PARC BL10, CSNS Back-n, and CSNS BL09, the terrestrial SER is overestimated. The overestimation could reach 78%–287%. By reducing the cutoff energy (Emin) from 10 to 6 MeV, the overestimation can be decreased. However, the overestimation can still reach up to 164% in this case, significantly larger than the results reported by previous studies. By analyzing the contribution of neutrons in different energy bins to NSEUs, the discrepancy is proved to be attributed to the sensitivity of NSEUs to 0.1–1 MeV neutrons, along with the overpopulation of 0.1–1 MeV neutrons for certain test facilities, such as ISIS ChipIR and CSNS BL09. Therefore, it is necessary to take 0.1–1 MeV NSEU sensitivity into account when studying the prediction method using broad spectrum neutron sources.

show abstract

SEE Testing on commercial power MOSFETs

Fernández-Martínez

Papadopoulou

Danzeca

et al. 2020

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

View full text Add to dashboard Cite

SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed-Field Facilities

Cited by 15 publications

References 17 publications

Impact of Energy Dependence on Ground Level and Avionic SEE Rate Prediction When Applying Standard Test Procedures

Impact of Energy Dependence on Ground Level and Avionic SEE Rate Prediction When Applying Standard Test Procedures

Influence of 0.1–10 MeV neutron-induced SEUs on estimation of terrestrial SER in a nano-scale SRAM

SEE Testing on commercial power MOSFETs

Contact Info

Product

Resources

About