2011 IEEE 9th International New Circuits and Systems Conference 2011
DOI: 10.1109/newcas.2011.5981325
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Security challenges during VLSI test

Abstract: Abstract-VLSI testing is a practical requirement, but unless proper care is taken, features that enhance testability can reduce system security. Data confidentiality and intellectual property protection can be breached through testing security breaches. In this paper we review testing security problems, focusing on the scan technique. We then present some countermeasures which have recently been published and we discuss their characteristics.

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Cited by 10 publications
(3 citation statements)
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“…The proposed method described hereafter reuses scan chain-based test methods and Logic built in self-test (LBIST) methods. Leveraging these methods speed up the PUF enrollment operation thanks to the known efficiency of scan chain operations and also allows to benefit from the dedicated security add-ons proposed in the literature to secure the IC testing infrastructures [11] and consequently address the security issues related to the enrollment. Connecting the PUF enrollment hardware module to the test infrastructure makes the use of standardized test access mechanism available to perform the enrollment during the post manufacturing operations.…”
Section: B Leveraging Secure Ic Testing Methods For Puf Enrollmentmentioning
confidence: 99%
“…The proposed method described hereafter reuses scan chain-based test methods and Logic built in self-test (LBIST) methods. Leveraging these methods speed up the PUF enrollment operation thanks to the known efficiency of scan chain operations and also allows to benefit from the dedicated security add-ons proposed in the literature to secure the IC testing infrastructures [11] and consequently address the security issues related to the enrollment. Connecting the PUF enrollment hardware module to the test infrastructure makes the use of standardized test access mechanism available to perform the enrollment during the post manufacturing operations.…”
Section: B Leveraging Secure Ic Testing Methods For Puf Enrollmentmentioning
confidence: 99%
“…Several scan-based attacks on hardware implementations of DES and AES have been demonstrated [Mukhopadhyay et al 2005;Bo et al 2006], showing that test facilities are an ideal starting point for identification of relevant internal nodes and for retrieving confidential information. Several test scan attack countermeasures have been published, but a universal minimum-cost solution for protection against test security threats [Hely et al 2011] does not exist.…”
Section: Secure By Designmentioning
confidence: 99%
“…It is difficult, even unattainable, to ensure full fault detection using conventional AC and DC electrical testing techniques. An additional security issue comes from fake circuits designed to avoid identification by conventional testing techniques [2]. To differentiate the counterfeit, forged, or damaged ICs from the authentic ICs, straightforward, thorough, non-destructive, and ubiquitous inspection and testing methods are needed.…”
Section: Introductionmentioning
confidence: 99%