Secondary roughness effect of surface microstructures on secondary electron emission and multipactor threshold for PTFE-filled and PI-filled single ridge waveguides
Xiangchen Meng,
Yanan Xu,
Zhuoxi Lian
et al.
Abstract:Secondary electron yield (SEY) is a dominant factor in determining the multipactor threshold. In this study, we analyzed the secondary roughness effect of surface microstructures for plastic dielectric on SEY reduction and multipactor mitigation. A single ridge waveguide (SRW) operating in Ku-band, filled with PTFE or PI, was designed with a dielectric-metal multipactor gap. By employing a femtosecond laser, periodic microstructures were fabricated on PTFE and PI surfaces to suppress SEY. The SEY peak values o… Show more
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