2019
DOI: 10.1016/j.ejmp.2019.06.001
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Secondary radiation measurements for particle therapy applications: Charged secondaries produced by 16O ion beams in a PMMA target at large angles

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Cited by 6 publications
(7 citation statements)
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“…Significant production of β + was also reported for 4 He ion on PMMA target [43]. Secondary proton fluence from 300 MeV/u 16 O induced reaction on PMMA target was measured to be (74.18 ± 0.40±13.02)x10 −3 sr −1 at 60 o and was ∼6.5 times lower at 90 o [14]. At 210 MeV/u 16 O beam energy, these values were ∼3.3-3.6 times lower.…”
Section: Experimental Studiesmentioning
confidence: 80%
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“…Significant production of β + was also reported for 4 He ion on PMMA target [43]. Secondary proton fluence from 300 MeV/u 16 O induced reaction on PMMA target was measured to be (74.18 ± 0.40±13.02)x10 −3 sr −1 at 60 o and was ∼6.5 times lower at 90 o [14]. At 210 MeV/u 16 O beam energy, these values were ∼3.3-3.6 times lower.…”
Section: Experimental Studiesmentioning
confidence: 80%
“…However, this pattern drastically changed near and beyond the distal end of the Bragg peak. Here, 11,12 C, 16 O, and 13,14,15 N had almost comparable LET [62]. Experimentally measured LET distribution of SCPs, for 380 MeV/u 12 C beam, was compared with the GEANT simulation [64,65].…”
Section: Simulation Studiesmentioning
confidence: 96%
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“…Such measurements were part of a complex experiment, exploited with a multi-purpose detector setup, aiming for the characterization of the interactions of different ion species of several energies with the purpose of studying the secondary particle emission trough the measurement of prompt photons, charged and β + -emitter fragments. More details can be found in (Mattei et al 2016, Rucinski et al 2016, Toppi et al 2016.…”
Section: Methodsmentioning
confidence: 99%