Secondary Ion Mass Spectrometry Microanalysis of Platinum in Hydrogenetic Ferromanganese Crusts

Morishita, Y.; Usui, Akira; Takahata, Naoto; Sano, Yuji

doi:10.1007/978-3-030-87982-2_5

Cited by 2 publications

(2 citation statements)

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“…SIMS depth profiling and quantification of Pt have further been performed relative to the Fe and Mn matrix elements of the mineral vernadite 16 . Recently, SIMS depth profiling was used to quantify trace levels of Pt in deep sea minerals 17 . Together with other advanced analytical methods, such as neutron activated analysis (NAA), transmission electron microscopy (TEM) and electron probe microanalysis (EPMA), SIMS has been proposed as a way to quantify sub‐surface mercury contamination in platinum iridium mass standards, similar to the one that defined the kilogram in the SI system until 2019 18 .…”

Section: Resultsmentioning

confidence: 99%

“…16 Recently, SIMS depth profiling was used to quantify trace levels of Pt in deep sea minerals. 17 Together with other advanced analytical methods, such as neutron activated analysis (NAA), transmission electron microscopy (TEM) and electron probe microanalysis (EPMA), SIMS has been proposed as a way to quantify sub-surface mercury contamination in platinum iridium mass standards, similar to the one that defined the kilogram in the SI system until 2019. 18 Perhaps the challenges faced by us when trying to use SIMS to quantify Pt in Pd have also applied to other investigations of precious metals, where it was decided to rather use alternative techniques where the quantification was more straightforward.…”

Section: Stage Cmentioning

confidence: 99%

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Challenges in quantifying Pt concentrations in Pd alloys by using secondary ion mass spectrometry: Strong grain orientation effects

Holme,

Håkonsen,

Waller

2024

Surface & Interface Analysis

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Palladium–platinum alloys were analysed by dynamic secondary ion mass spectrometry (SIMS) to investigate grain orientation effects that gave differences of up to 400% in the Pt/Pd count rate ratios, even within the same grain upon small rotations of a Pd sample with 1 wt% Pt. The sample had been homogenized by annealing, and the homogeneity was confirmed by X‐ray analysis in scanning electron microscopy (SEM). Grain orientations were determined by electron backscatter diffraction (EBSD). Crater depths were measured by white light interferometry (WLI). SEM images from the bottom of SIMS craters made in the same grain after small rotations around the sample surface normally showed different patterns of microfaceting for some rotation angles, probably exposing low‐index crystallographic planes. A complete understanding of the observed grain orientation effect is still lacking. However, factors such as ion mass, sputter rate, ion channelling, ion focusing, preferential sputtering, surface height, crater microfaceting and/or angle‐dependent sputtering seem to play a role. For these Pd–Pt alloys, the strong grain orientation effect adds another level of complexity when attempting to quantify concentrations and obtain depth profiles by SIMS. Without proper sampling and/or averaging, one could reach very wrong conclusions when comparing results from different samples.

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Section: Resultsmentioning

confidence: 99%