2020
DOI: 10.1016/j.elspec.2019.07.004
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Secondary electron generation mechanisms in carbon allotropes at low impact electron energies

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Cited by 24 publications
(16 citation statements)
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“…Because of a low electron inelastic mean free path (<1 nm) in this energy range, low-energy SEY is particularly sensitive to the outermost composition of the surface. For Cu and other metal surfaces [20,83,84] as well as for carbon-based materials [85,86] these aspects were previously discussed. Further detailed studies focusing on the description of these features are the topic of forthcoming research.…”
Section: B Secondary-electron Yieldmentioning
confidence: 97%
“…Because of a low electron inelastic mean free path (<1 nm) in this energy range, low-energy SEY is particularly sensitive to the outermost composition of the surface. For Cu and other metal surfaces [20,83,84] as well as for carbon-based materials [85,86] these aspects were previously discussed. Further detailed studies focusing on the description of these features are the topic of forthcoming research.…”
Section: B Secondary-electron Yieldmentioning
confidence: 97%
“…Therefore, the SE is sensitive to the morphology and composition of the sample surface, so microscopic characteristics can be reflected by the SE. [ 69,70 ] Figure 10 shows microimages of three sandstones with different grain sizes measured by SEM. The pores and throats are smaller and less obvious in the denser sandstone.…”
Section: Pore Structure Characterizationmentioning
confidence: 99%
“…From this perspective there is a clear difference between DPE and two-electron emission via particle impact (for electron impact, the process is usually referred to as (e,2e)), even though in both DPE and (e,2e) two electrons are released at the same time from the sample into vacuum. A series of studies have been conducted to unveil the various mechanisms involved in (e,2e) and the physics underlying them (for instance [8][9][10][11][12][28][29][30][31] ). We discuss below prominant examples in the reflection mode (i.e., when all electrons are detected on one side of the film or surface).…”
Section: Two-electron Emission Following the Charged-particle Impactmentioning
confidence: 99%
“…These complications can be remedied by conducting the experiments at somewhat lower energies and in the reflection mode. [8][9][10][11][12][13] In this case, further processes set in, however, that can be exploited to gain qualitatively new information. At low energies the two released electrons cannot be considered independent anymore due to charge-and current-density interactions as well as due to exchange, meaning that the scattering process cannot not be captured by an effective single-particle problem.…”
mentioning
confidence: 99%