Secondary Electron Emission of Pt: Experimental Study and Comparison With Models in the Multipactor Energy Range

Bronchalo, E.; Coves, Á.; Boria, Vicente E.; Gimeno, B.; Montero, I.; Galán, L.; Mercade, Laura; Sanchis-Kilders, E.

doi:10.1109/ted.2016.2580199

Cited by 13 publications

(7 citation statements)

References 33 publications

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“…Therefore, the electrical performance of the waveguide transformer will scarcely be modified when adding the dielectric film. It is well known that the SEY depends on material, primary electron kinetic energy, incident angle and surface state (surface composition, morphology of the structure, porosity and roughness) [15], [16]. The SEY properties of the metallic and dielectric materials employed in this experiment have been measured at the VSC/ESA laboratory, Valencia (Spain) [17], and they have been used in the multipactor simulations shown in the next section.…”

Section: Simulation Model and Sey Measurementsmentioning

confidence: 99%

Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide

Berenguer

Coves

Gimeno

et al. 2019

IEEE Microw. Wireless Compon. Lett.

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This letter presents the experimental study of the multipactor threshold in a partially dielectric-loaded rectangular waveguide, whose results validate a multipactor model recently developed by the authors, which includes the charge distribution appearing on the dielectric surface during the multipactor discharge. First, the variation of the multipactor RF voltage threshold has been theoretically analyzed in different waveguide configurations: in an empty waveguide, and also in the cases of a one-sided and two-sided dielectric-loaded waveguides. To reach this aim, an in-house Monte-Carlo simulation tool has been developed. The Secondary Electron Yield (SEY) of the metallic and dielectric materials used in the numerical simulations have been measured experimentally. Finally, an aluminum WR-75 symmetric E-plane rectangular waveguide transformer has been designed and fabricated, in which several multipaction tests have been carried out to validate the in-house software tool, demonstrating an excellent agreement between the simulation results and the experimental data.

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Section: Simulation Model and Sey Measurementsmentioning

confidence: 99%

Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide

Berenguer

Coves

Gimeno

et al. 2019

IEEE Microw. Wireless Compon. Lett.

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“…Using a simple model for the resistor R C = (1/κ)(d/A), and the capacitance C = ε(A/d), where A is the area of the electron beam on the sample, and d is the thickness of the sample, we notice that A and d vanish and τ OFF becomes τ OFF = ε κ (12) which is usually called the Maxwell relaxation time. When the sample is charged, the effective SEY changes.…”

Section: ) Solution In Continuous Modementioning

confidence: 99%

“…If we now compare the conductivities of all samples, according to Table I, it is evident that the natural discharge needs more time when the conductivity becomes lower, because, as seen in (12), τ OFF ∝ κ −1 . Therefore, the differences in the pulsed and continuous curves can be explained taking into account that, in the pulsed mode, the sample is able to recombine itself.…”

Section: B Sey Against Primary Energy Measurementsmentioning

confidence: 99%

“…Beginning with the first articles [9]- [11], where the first experiments to measure SEE were described, we can find more recent works that address this problem which is especially complex in the case of dielectrics. Every material presents a characteristic SEY which also depends on the primary electron energy E p ; in this line, it is common to represent SEY versus E p curves on experimentl results [12] and theoretical simulations [13]. A qualitative scheme of the parts of an SEY curve can be found in [14].…”

Section: Introductionmentioning

confidence: 99%

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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

Banon-Caballero

Socuellamos

Boria³

et al. 2018

IEEE Trans. Plasma Sci.

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Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

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“…being k B the Boltzmann constant, p the gas pressure, T the absolute temperature in Kelvin, and πd 2 the effective cross-section area for spherical particles of diameter d. Multipactor may happen in several parts of a device, being the critical gap the one in which the weakest RF fields initiates the multipactor breakdown, see Fig 2 The Secondary Emission Yield (SEY) curve [53,54,55,56] models the physics of the electron-surface collision. An example curve can be found in Fig.…”

Section: Multipactor Physicsmentioning

confidence: 99%

Advanced Techniques for Multipactor Testing

Belda¹

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ehexgih igrxsi py wvsegy isxq ysr wonerris feld hesis dvisorX hrF iente iF fori isert hesis oEdvisorX hrF fenito qimeno wrt¡ %nez hh hesis presented t niversitt olit eni de l eni leniD tnury PHPQ Abstract sn the reent pstD there hs een prolifertion of new stellite systemsD espeilly the lrge onstelltions in the vow irth yrits @viysAF xerly ll stellites now rry digitl tr0 with vriety of modultions nd power levelsF xot only thtD the usiness model requires rpid deployment of stellitesD putting enormous onstrints for the suppliers of mirowve pylod hrdwreF e key risk re for suh equipment remins the multiptor rekdown under moderte to high power levelsF ywing to the inherent rndomness of the multiptor phenomenonD ustomers tend to dd extr design mrgins for the high power mirowve omponentsF his results in higher ostsD ulkier devies nd longer time for testingF fsed on personl experiene in multiptor testingD the prime motivtor for the work desried in the thesis hs een to undertke omprehensive review of this phenomenon nd develop utting edge multiptor test pilitiesD providing mens for the rpid multiptor testing under vriety of wideEnd modulted signlsF he thesis disserttion shows tht nlog nd digitl modultions hve signi(nt impt in the multiptor thresholdF he short nd longEterm multiptor regimes re lso nlyzedD regimes thtD in some sesD hve very di'erent multiptor thresholds for the sme ritil gpF he need to redue the mirowve pylod weight y using multirriers in single trnsponder provides n exellent option for designersF fy routing severl signls through the sme devieD the pylod weight is drmtilly reduedF gommeril solutions for multirrier testing re not suitle euse of the high power levels requiredF everl strtegies to implement multiptor test enhes with ontrollle prmeters re presentedF esults prove tht the signl eing fed to the devie under tests is urte nd stle over timeF pinllyD novel multiptor detetion system is proposed to ope with multiptor detetion when modulted nd multirrier signls of ny ndwidth re usedF his method hs the sme sensitivity s the well known mirowve nulling for ontinuous wve signls nd surpsses it for modulted signlsF he digitl signl proessing used to detet the multiptor ptterns provides full utonomous detetion methodF Contents eknowledgments v esum vi

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Secondary Electron Emission of Pt: Experimental Study and Comparison With Models in the Multipactor Energy Range

Cited by 13 publications

References 33 publications

Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide

Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide

Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

Advanced Techniques for Multipactor Testing

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