Secondary electron emission chamber for measuring the intensity of slowly extracted beams

Abstract

A secondary electron emission chamber for measuring the proton beam intensity in a range of 10 11 -10 13 protons/s is described. The instrument is used to diagnose intense particle beams extracted from the U 70 accelerator at the Institute for High Energy Physics (IHEP). The design details of the chamber and the features of its production technique are described. The characteristics of the chamber components are presented.