Screening and Testing Method of Area Detectors for Directional Polarimetric Camera

Pingping, 姚萍萍 Yao; Sunlong, 许孙龙 Xu; Bihai, 涂碧海 Tu; Shanshan, 崔珊珊 Cui; Jie, 金洁 Jin; Donggen, 骆冬根 Luo; Jin, 洪津 Hong

doi:10.3788/aos202040.1112002

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“…The short-wave infrared probe of SMAC uses the area array COMS detector with small size, light weight, low power consumption and high resolution as the image sensor. With the development of China's aerospace technology, the import restrictions of aerospace optoelectronic conversion devices are becoming more and more stringent 3 . Therefore, it is a feasible and low-cost method to carry out the performance screening experiment of low-grade area array COMS detector 4 .…”

Section: Introductionmentioning

confidence: 99%

Screening and testing methods of short-wave infrared area array detectors for synchronous monitoring atmospheric corrector

Li²,

Liu³

et al. 2022

Thirteenth International Conference on Information Optics and Photonics (CIOP 2022)

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In order to select the devices with high reliability and stability with the potential of aerospace application from the scientific shortwave infrared array detector, the performance test and screening experiment of the shortwave infrared array COMS photoelectric conversion detector equipped with Synchronous Monitoring Atmospheric Corrector were carried out. Firstly, according to the aerospace application requirements, the main performance parameters of shortwave infrared array CMOS devices are simulated and analyzed. Secondly, a set of special image acquisition system of shortwave infrared array CMOS device is designed. Aiming at the performance parameters which can cover the whole spectrum, such as photo response nonuniformity, defect pixels, nonlinearity error and so on, a wide spectrum testing platform based on segmented uniform light source is built. Aiming at the monochromatic performance parameters such as quantum efficiency, a multispectral testing platform based on continuous tunable light source is built. Finally, the performance screening experiments of shortwave infrared array CMOS detectors are carried out by using these test systems, and performance parameters of the tested devices are obtained. The experimental results show that the photo response nonuniformity of the optimized shortwave infrared CMOS detector is 2.79% in 1380 nm band, the number of defect pixels is 4, the maximum non-repeatability of quantum efficiency is 2.18%, and the nonlinearity error is less than 1.16%. The index of the selected device meets the needs of aerospace applications. The research results provide a reference for the screening method and performance evaluation of shortwave infrared array detectors.

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Section: Introductionmentioning

confidence: 99%