2008
DOI: 10.1166/sl.2008.414
|View full text |Cite
|
Sign up to set email alerts
|

Screen-Printed Tin-Doped Indium Oxide Films for Low Temperature and Fast Response Methanol Gas Sensing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2010
2010
2015
2015

Publication Types

Select...
6

Relationship

3
3

Authors

Journals

citations
Cited by 9 publications
(8 citation statements)
references
References 0 publications
0
7
0
Order By: Relevance
“…The use of ITO as a sensitive layer for gas sensor applications was demonstrated in many works [6][7][8].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The use of ITO as a sensitive layer for gas sensor applications was demonstrated in many works [6][7][8].…”
Section: Introductionmentioning
confidence: 99%
“…The greater part of these studies was made in DC measurements. While direct current DC measurements give information on the global sensor response, AC impedance study is a powerful tool to understand the nature of the conduction processes and the mechanism of gas/solid interactions, as the processes of different time constants can be distinguished by varying the frequency [8,16]. Consequently, the objective of this work is to study the effect of temperature and NO 2 adsorption on the dielectric properties of ITO.…”
Section: Introductionmentioning
confidence: 99%
“…The In 2 O 3 -SnO 2 (35 wt% Sn) nanocomposite has spherical-like grains with an average size of about 14 -18 nm ( Fig. 2(b)), whereas an average size of about 12 nm was observed for In 2 O 3 -SnO 2 (10 wt% Sn) [6]. Inter-planar spacing of about 0.29 nm and 0.25 nm are found, which corresponds to the (222) and (400) plans of In 2 O 3 , respectively; hence, no evidence crystalline SnO 2 phase was detected.…”
Section: Methodsmentioning
confidence: 97%
“…Eq. (5) was solved by considering values of different parameters summarized in Table 1 and by considering values of refractive index of silicon from [13] and refractive index of MeOH from [14]. A quantitative model applying the EMT may take into account the effective refractive index change of the meso-PSL.…”
Section: Psl Modelingmentioning
confidence: 99%