Abstract:LEEM is a well established method for the imaging of surfaces of materials using the impact of very slow electrons (down to zero energy ‐ mirror microscopy). On the other hand, scanning electron microscopy has not consistently solved the detection of electrons in the mirror mode, i.e. in the incident energy range of 3 to 0 eV. In contrast to LEEM, which forms an integral image of the specimen surface and projects it onto an image screen, the scanning method relies on the detection of signals from individual pi… Show more
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