SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise

Abstract

The knowledge of the noise levels is important for pump laser diodes as it allows to study and to locate the noise sources and their origin. 980 nm fresh and aged pump lasers have been characterized by using electrical noise measurements. At 10 Hz, the spectra are dominated by () noise. Current noise spectral density (CNSD) is dominated by (). The trapping defect density near the n+n- and p+p- interfaces is related to pinching of the space-charge-limited current (SCLC) effect. An excess electrical noise due to longitudinal mode hopping is correlated with optical power fluctuations.