2014
DOI: 10.1134/s1064226914040123
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Scattering of surface acoustic waves by a system of topographical irregularities comparable to a wavelength

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Cited by 5 publications
(1 citation statement)
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“…This aspect of the RFID tag development requires the topology to be exactly calculated with the actual geometry of the electrodes, reflectors, and SAW scattering fields [3][4][5] taken into account, a condition that is necessary for alignment of the amplitudes of the reflected (code) pulses. The high precision has been obtained through the use of the FEM/BEM [6][7][8][9][10]. For the calculation to be exact, it is also necessary to take into account the difference between the elastic properties of the alumi num thin films and bulk material [11].…”
Section: Introductionmentioning
confidence: 99%
“…This aspect of the RFID tag development requires the topology to be exactly calculated with the actual geometry of the electrodes, reflectors, and SAW scattering fields [3][4][5] taken into account, a condition that is necessary for alignment of the amplitudes of the reflected (code) pulses. The high precision has been obtained through the use of the FEM/BEM [6][7][8][9][10]. For the calculation to be exact, it is also necessary to take into account the difference between the elastic properties of the alumi num thin films and bulk material [11].…”
Section: Introductionmentioning
confidence: 99%