Scattering from moderately rough interfaces between two arbitrary media

Harvey, James E.; Choi, Narak; Krywonos, Andrey

doi:10.1117/12.863995

Cited by 20 publications

(14 citation statements)

References 19 publications

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“…16,18 For normal incidence, those spatial frequencies greater than 1∕λ produce evanescent (imaginary) waves that do not result in radiant power being scattered from the specular beam-i.e., spatial frequencies greater than 1∕λ are completely irrelevant with regard to scattered light. 3(a), i.e., a circle of radius 1∕λ whose center is shifted to a spatial frequency 33 given by 3(a), i.e., a circle of radius 1∕λ whose center is shifted to a spatial frequency 33 given by…”

Section: Surface Characteristicsmentioning

confidence: 99%

Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

Harvey

2012

Opt. Eng

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173

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Downloaded From: http://opticalengineering.spiedigitallibrary.org/ on 08/13/2015 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx Abstract. Surface scatter effects from residual optical fabrication errors can severely degrade optical performance. The total integrated scatter (TIS) from a given mirror surface is determined by the ratio of the spatial frequency band-limited "relevant" root-mean-square surface roughness to the wavelength of light. For short-wavelength (extreme-ultraviolet/x-ray) applications, even state-of-the-art optical surfaces can scatter a significant fraction of the total reflected light. In this paper we first discuss how to calculate the band-limited relevant roughness from surface metrology data, then present parametric plots of the TIS for optical surfaces with arbitrary roughness, surface correlation widths, and incident angles. Surfaces with both Gaussian and ABC or K -correlation power spectral density functions have been modeled. These parametric TIS predictions provide insight that is useful in determining realistic optical fabrication tolerances necessary to satisfy specific optical performance requirements.

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Section: Surface Characteristicsmentioning

confidence: 99%

Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

Harvey

2012

Opt. Eng

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173

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“…Furthermore the OHS and MHS scattering theories were restricted to mirror surfaces, and did not include the more general situation of scattering from a random rough interface between two media with arbitrary refractive indices [46].…”

Section: Summary Of Surface Scatter Theories: Evolution Of the Surfacmentioning

confidence: 99%

Integrating optical fabrication and metrology into the optical design process

Harvey¹

2015

Appl. Opt.

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The recent validation of a generalized linear systems formulation of surface scatter theory and an analysis of image degradation due to surface scatter in the presence of aberrations has provided credence to the development of a systems engineering analysis of image quality as degraded not only by diffraction effects and geometrical aberrations, but to scattering effects due to residual optical fabrication errors as well. This generalized surface scatter theory provides insight and understanding by characterizing surface scatter behavior with a surface transfer function closely related to the modulation transfer function of classical image formation theory. Incorporating the inherently band-limited relevant surface roughness into the surface scatter theory provides mathematical rigor into surface scatter analysis, and implementing a fast Fourier transform algorithm with logarithmically spaced data points facilitates the practical calculation of scatter behavior from surfaces with a large dynamic range of relevant spatial frequencies. These advances, combined with the continuing increase in computer speed, leave the optical design community in a position to routinely derive the optical fabrication tolerances necessary to satisfy specific image quality requirements during the design phase of a project; i.e., to integrate optical metrology and fabrication into the optical design process.

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“…However, the restriction of small scattering angles is still very limiting. Furthermore the OHS and MHS scattering theories were restricted to mirror surfaces, and did not include the more general situation of scattering from a random rough interface between two media with arbitrary refractive indices [28].…”

Section: Transfer Function Characterization Of Scattering Surfacesmentioning

confidence: 99%

Effect of surface scatter upon the MTF of the solar ultra violet imager (SUVI) telescope

Harvey¹,

Choi

2013

Solar Physics and Space Weather Instrumentation V

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The solar UV imager (SUVI) is an extreme ultraviolet instrument that will fly on the Geostationary Operational Environmental Satellite (GOES)-R and-S platforms, as part of NOAA's space weather monitoring fleet. It will provide important information on solar activity and the effects of the Sun on the earth and the near-earth environment. This instrument will image the full solar disc in 6 EUV wavebands between 303.8 Å and 93.9 Å. A generalized Cassegrain telescope configuration is employed where six mirror sectors utilize multilayer coatings optimized for the six wavelengths of interest. An aperture shutter is used to select the appropriate sector for observations at a particular wavelength. A thinned, back-illuminated CCD sensor with 21m (2.5 arcsec) pixels resides in the telescope focal plane. The modulation transfer function (MTF) is usually considered to be the image quality criterion of choice for applications where fine detail in extended images needs to be specified or evaluated. However, the contractual image quality requirement was specified in terms of fractional ensquared energy for a variety of different wavelengths and square sizes. In this paper we will calculate and present MTF plots (as degraded by diffraction, geometrical aberrations, surface scatter effects and detector effects) for each of the SUVI wavelengths of interest. Surface scatter due to residual optical fabrication errors is a major factor limiting the performance at the shorter wavelengths, and the large detector size severely limits the performance at all SUVI wavelengths.

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Scattering from moderately rough interfaces between two arbitrary media

Cited by 20 publications

References 19 publications

Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

Integrating optical fabrication and metrology into the optical design process

Effect of surface scatter upon the MTF of the solar ultra violet imager (SUVI) telescope

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