Abstract:The technique of angle resolved mapping of scattering and recoiling imaging spectra (SARIS) combined with computer simulations is demonstrated to be a valuable tool for characterization of atomic collision events on surfaces. The energy distributions of scattered Kr and Ne and fast recoiled Pt and Ni atoms from Pt(111) and Ni(111) surfaces were measured as a function of exit angle. The use of a large area microchannel plate (MCP) detector and time-of-flight (TOF) techniques decreases the collection time and in… Show more
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