1995
DOI: 10.1002/9783527616787.ch1
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Scanning Tunneling Microscopy of Semiconductor Electrodes

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Cited by 10 publications
(4 citation statements)
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“…The first one concerns the preparation of clean reconstructed surfaces of noble metal single crystals at ambient by annealing in a butane or a hydrogen flame: this technique is called 'flame annealing' and it works principally with Au and Pt [17]. The second one concerns the advent of the electrochemical STM for in situ real time observations of surface processes with the atomic resolution at metal [18][19][20][21] and semiconductor electrodes [22]. During the past two decades numerous fundamental in situ STM studies have focused on the growth mechanisms of high quality ultrathin epitaxial layers on single-crystal surfaces for their specific catalytic, corrosion protection and magnetic properties.…”
Section: Introductionmentioning
confidence: 99%
“…The first one concerns the preparation of clean reconstructed surfaces of noble metal single crystals at ambient by annealing in a butane or a hydrogen flame: this technique is called 'flame annealing' and it works principally with Au and Pt [17]. The second one concerns the advent of the electrochemical STM for in situ real time observations of surface processes with the atomic resolution at metal [18][19][20][21] and semiconductor electrodes [22]. During the past two decades numerous fundamental in situ STM studies have focused on the growth mechanisms of high quality ultrathin epitaxial layers on single-crystal surfaces for their specific catalytic, corrosion protection and magnetic properties.…”
Section: Introductionmentioning
confidence: 99%
“…As is evident from Figure a, four different types of sites can be seen. The blue arrows in Figure point to brighter spots on the surface that are likely dangling bonds or −OH bonds. , Defect sites, which are typically missing silicon atoms, are circled in red. Most of the surface that is not specifically highlighted is hydrogen terminated, represented by their flat profiles in the STM image.…”
Section: Results and Discussionmentioning
confidence: 99%
“…The problems are described in the literature and in special reviews, e.g., by Allongue. 24 The special situation of the tip in front of a semiconductor is shown in Figure 9.16 for vacuum conditions and in Figure 9.17 in an electrochemical cell.…”
Section: Microscopymentioning
confidence: 99%