Scanning Probe Techniques

Kühnle, Angelika; Reichling, Michael

doi:10.1002/9783527680535.ch11

Cited by 2 publications

(1 citation statement)

References 284 publications

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“…The primary imaging signal in NC-AFM is the frequency shift Δ f of a probe resonator carrying a tip interacting with the sample surface [2], typically a cantilever, a tuning fork, or a needle sensor [8]. …”

Section: Introductionmentioning

confidence: 99%

Noise in NC-AFM measurements with significant tip–sample interaction

Lübbe¹,

Temmen²,

Rahe³

et al. 2016

Beilstein J. Nanotechnol.

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The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density D Δ f(f m) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral characteristics are determined by the strongly non-linear tip–sample interaction, by the coupling between the amplitude and tip–sample distance control loops of the NC-AFM system as well as by the characteristics of the phase locked loop (PLL) detector used for frequency demodulation. Here, we measure D Δ f(f m) for various NC-AFM parameter settings representing realistic measurement conditions and compare experimental data to simulations based on a model of the NC-AFM system that includes the tip–sample interaction. The good agreement between predicted and measured noise spectra confirms that the model covers the relevant noise contributions and interactions. Results yield a general understanding of noise generation and propagation in the NC-AFM and provide a quantitative prediction of noise for given experimental parameters. We derive strategies for noise-optimised imaging and spectroscopy and outline a full optimisation procedure for the instrumentation and control loops.

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Section: Introductionmentioning

confidence: 99%

Noise in NC-AFM measurements with significant tip–sample interaction

Lübbe¹,

Temmen²,

Rahe³

et al. 2016

Beilstein J. Nanotechnol.

Self Cite

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Electrochemical Scanning Tunneling Microscopy

Gentz

Wandelt

2012

Chimia

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The electrochemical scanning tunneling microscope was the first tool for the investigation of solid-liquid interfaces that allowed in situ real space imaging of electrode surfaces at the atomic level. Therefore it quickly became an important addition to the repertoire of methods for the determination of the local surface structure as well as the dynamics of reactions and processes taking place at surfaces in an electrolytic environment. In this short overview we present several examples to illustrate the powerful capabilities of the EC-STM, including the observation of clean metal surfaces as well as the adsorption of thin metal layers, specifically adsorbed anions and non-specifically adsorbed organic cations. In several cases the electrode potential has a significant influence on structure and reactivity of the surface that can be explained by the observations made with the EC-STM.

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Scanning Probe Techniques

Cited by 2 publications

References 284 publications

Noise in NC-AFM measurements with significant tip–sample interaction

Noise in NC-AFM measurements with significant tip–sample interaction

Electrochemical Scanning Tunneling Microscopy

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