Compendium of Surface and Interface Analysis 2018
DOI: 10.1007/978-981-10-6156-1_94
|View full text |Cite
|
Sign up to set email alerts
|

Scanning Probe Microscopy

Abstract: Lesson: Scanning Probe Microscopy: "feeling" what you can't see at the nanometer scale Standards:HS-PS1-3. Plan and conduct an investigation to gather evidence to compare the structure of substances at the bulk scale to infer the strength of electrical forces between particles.HS-PS2-6. Communicate scientific and technical information about why the molecular-level structure is important in the functioning of designed materials.HS-PS2-1. Analyze data to support the claim that Newton's second law of motion descr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 2 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?