Scanning probe microscopy (tunneling, atomic force, confocal and acoustic) in particle track detectors

Vuković, J.; Antanasijević, R.

doi:10.1016/1350-4487(95)00240-f

Cited by 4 publications

(2 citation statements)

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“…AFM studies of bulk etch rate and surface roughness Application of the atomic force microscope (AFM) is a relatively new technique for track studies. The survey of different kinds of scanning microscopes and their applications in track studies were given by Vukovic and Atanasijevic [76]. AFM enabled very accurate measurements of the bulk etch rate by the ''masking'' method [71,77].…”

Section: Direct Measurements Of V Bmentioning

confidence: 99%

“…Explanation of operation principles and comparisons among different scanning microscopes in track studies (including confocal microscopes, scanning tunneling microscopes, scanning force microscopes) were given by Vukovic and Atanasijevic [76]. Confocal microscopy was used by Gais et al [101] to study alpha tracks originated from radon and its progeny in the CR-39 detector.…”

Section: Survey Of V Function Measurements For Various Detectorsmentioning

confidence: 99%

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Formation and growth of tracks in nuclear track materials

Nikezić

2004

Materials Science and Engineering: R: Reports

372

163

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This paper reviews some aspects of solid-state nuclear track detectors (SSNTDs) and their applications in the radon and other research fields. Several geometrical models for the track growth given in the literature are described and compared. It is found that different models give close results for the dimensions of track openings.One of the main parameters that govern track formation is the bulk etch rate V b . Dependences of V b on different parameters such as the preparation procedures, etching conditions, irradiation before etching, etc. are examined. A review of existing methods for determination of the bulk etch rate and track etch rate V t is also given. Examples of V t functions for some detectors are presented. Some unsolved questions related to V t and some contradictory experimental results published in the literature are also summarized in the paper.Applications of SSNTDs for radon and progeny measurements are discussed. New designs of diffusion chambers that have appeared in the last few years are portrayed. A review of analytical and Monte Carlo methods for the calculation of the calibration factors in radon measurements is presented.Particular attention has been given to methods of long-term passive measurements of radon progeny with SSNTDs. These measurements are rather difficult and there is not yet a widely accepted solution. One possible solution based on the LR 115 SSNTD is outlined here.Methods for retrospective radon measurements are also described. Various applications of SSNTDs in other fields of physics and other sciences are briefly reviewed at the end of the paper. #

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Section: Direct Measurements Of V Bmentioning

confidence: 99%

Section: Survey Of V Function Measurements For Various Detectorsmentioning

confidence: 99%