Scanning near‐field optical microscopy on rough surfaces: Applications in chemistry, biology, and medicine

Kaupp, Gerd

doi:10.1155/ijp/2006/69878

Cited by 8 publications

(13 citation statements)

References 19 publications

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“…They indicate the generality of the effect with very different types of materials and shear-force mechanisms. The slope values cover two magnitudes and that is the reason for the exceptionally strong optical contrast that is achieved with this type of apertureless SNOM even at small chemical differences [1,22,23,30]. Similar slope values were obtained when using 632.8 nm light [8].…”

Section: Performance Of the Reflectance Enhan-cement In The Shear-forsupporting

confidence: 66%

“…It is therefore timely to remove severe misunderstandings and prejudices, inasmuch as our technique is outstanding for all of the important applications of SNOM, which are listed in the Introduction. There is no cross-talk between our SNOM and AFM, because we profit from the enhancement effect [1,2,[22][23][24], and if there is remaining doubt one can use a filter for removal of any presumed light from the control laser. This will be exhaustively demonstrated below.…”

Section: Techniques and Experimentsmentioning

confidence: 99%

“…The applications of apertureless scanning nearfield optical microscopy (SNOM or NSOM) with optical shear-force control have already been reviewed [1,2]. By virtue of the reflectance enhancement in the shear-force gap the easy technique could be used on surfaces with low to high corrugation.…”

Section: Introductionmentioning

confidence: 99%

“…The easily pulled tip (at almost no cost) must not be abraded or broken and that is most easily controlled with the intensity meter. Ease of operation and the always secured physical effect of strong enhancement of the reflected light in the shear-force gap back-to-the-sharp-tip enabled valid SNOM in virtually all branches of science and daily life with excellent repeatable interpretable contrast and without topographical artifacts [1,2]. This deserves a timely review on the basics of our apparently widely unexpected effect that deals with near-field behavior of materials when illuminated in the shear-force gap [8].…”

Section: Introductionmentioning

confidence: 99%

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The Enhancement Effect at Local Reflectance and Emission Back to Apertureless SNOM Tips in the Shear-Force Gap

Kaupp¹

2011

TOSURSJ

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Physical basics, technique, equipment, proper experimental conditions, and performance of apertureless reflection back-to-the-fiber SNOM (Rayleigh, Raman, fluorescence) under shear-force control are reported. This technique achieves optical resolutions of < 10 nm on flat surfaces and < 20 nm in the presence of topographies with very sharp tips (< 10 -20 nm end radius). It works due to the large enhancement of the reflection to very sharp tapered uncoated tips in the shear-force gap. The dependence of preset vibration damping is linear with variations between different chemical entities. Thus, the optical contrast appears as chemical contrast in reflection or emission. Such enhancement is however not obtained with blunt tips (> 30 nm end radius or broken). Typical images for all thinkable situations show that topographical artifacts are excluded and that, unlike conventional aperture SNOM, precise site coincidence of optical contrast and chemical variation (often traceable in the topography) is obtained on planes, hills, slopes, depressions, and hidden geodes, even on very rough surfaces that give, however, no optical contrast if they are chemically uniform. Furthermore, positive and negative contrast on hills, slopes, and depressions is featured within the same SNOM image each. Object sizes range from 30 nm in small scans to 25 m in 40 m wide scans. The versatile technique is therefore qualified for applications on real world samples without severe manipulations just as they occur in science, technique, and medicine. The principal differences of apertureless SNOM with collection in the shear-force gap and conventional SNOM are worked out.

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Section: Performance Of the Reflectance Enhan-cement In The Shear-forsupporting

confidence: 66%

Section: Techniques and Experimentsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

The Enhancement Effect at Local Reflectance and Emission Back to Apertureless SNOM Tips in the Shear-Force Gap

Kaupp¹

2011

TOSURSJ

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“…Various means of microscopy including such as simultaneous AFM (atomic force microscopy) and SNOM (scanning near-field optical microscopy) play important role in comprehensive characterization of nanomaterials providing their visualization [1][2][3][4]. The simultaneous optical scanning together with the topography probing provides useful appropriate image exhibiting further morphology details of a supramolecular structure.…”

Section: Introductionmentioning

confidence: 99%

Behavior of Self-assembled Mn(III)/Mn(II)-NEt3 Conjugate on Different Support Observed by AFM-SNOM

Udal’tsov¹

2016

JCCE

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Et 3 N (Mn II -triethylamine) complex conjugated with binuclear Mn III -hydroxide, Mn 2 (OH) 3 Cl and similar manganese complex with Et 2 NH (diethylamine) self-assembled in aqueous solutions have been investigated by simultaneous AFM (atomic force microscopy) and SNOM (scanning near-field optical microscopy) in thin layers prepared on mica and PET (polyethylene terephthalate). The size of the particles after crystallization of the precipitated former conjugate was controlled with XRD (X-ray diffraction). It is found that the conjugate self-assembling produces the smallest grains with the diameter of 65 ± 7.5 nm measured at contact with the support. This particle size matches the crystallite size of 44.2 nm found by XRD for the conjugate taking into account the particles deformation under the contact with the support. The self-assembly of the smallest particles in solution has produced non-transparent for light core observed on mica with the size varied between 300 to 400 nm. The latter occurs due to hydrophobic interactions since no core of the former conjugate has been found on hydrophobic PET surface. No submicroscopic core is also found in the case of similar conjugate with Mn II -Et 2 NH complex on PET film and mica both.

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Scanning Near‐Field Optical Microscopy ( SNOM )

Kaupp

2012

Supramolecular Chemistry

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The successful artifact‐free scanning near‐field optical microscopy (SNOM) for rough surfaces with the versatile apertureless internal reflection in the shear‐force gap technique is reviewed and compared with the difficulties associated with apertureless scattering and aperture SNOM techniques. The most economical technique requires sharp, economically self‐pulled, tapered waveguide tips and is enabled by a unique reflection enhancement in the shear‐force gap that depends linearly on the damping settings. Owing to numerous factors that determine the enhancement, strong chemical contrasts are obtained even between similar materials on composite materials. Unlike aperture SNOM, the contrast in an internal‐reflection SNOM is precisely at the site of the chemical interface and the optical resolution is below 10 nm, which is equal to or better than the simultaneous AFM resolution at tip radii of about 10 nm. This enables efficient local spectroscopy (fluorescence, Raman, SERS), industrial (dental alloys, textile dyeing, nanoparticle dyes, sustainable chemical production, etc.), and medicinal applications (organelles, cancer prediagnosis, etc.), and helps in the elucidation of supramolecular mechanisms, all at the nanometric level. SNOM analyses of waste‐free supramolecular gas–solid and solid–solid reactions secure far‐reaching anisotropic molecular migrations within crystals, and also in solid‐state photoreactions. Such mechanistic foundation was not possible with previous “topochemistry” hypotheses, which impeded the maturing of the unparalleled sustainable supramolecular productions, by forbidding these migrations.

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Scanning near‐field optical microscopy on rough surfaces: Applications in chemistry, biology, and medicine

Cited by 8 publications

References 19 publications

The Enhancement Effect at Local Reflectance and Emission Back to Apertureless SNOM Tips in the Shear-Force Gap

The Enhancement Effect at Local Reflectance and Emission Back to Apertureless SNOM Tips in the Shear-Force Gap

Behavior of Self-assembled Mn(III)/Mn(II)-NEt3 Conjugate on Different Support Observed by AFM-SNOM

Scanning Near‐Field Optical Microscopy ( SNOM )

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