Scanning near-field cathodoluminescence microscopy

Cathodoluminescence Properties of Zno Thin Films

“…Our CL system, in association with a spectrometer (Triax 190 from JOBIN YVON), allows monochromatic CL imaging as well as acquisition of CL spectra on very localized spots of a sample. The mechanical details of our homemade SFM microscope, implemented inside the SEM, are reported in [37]. In this paper, the photons enter directly a multimode optical fiber (numerical aperture = 0.48) leading to far-field images or spectra.…”

Integrating electron and near-field optics: dual vision for the nanoworld

“…An optical multimode fiber was placed above a Si 3 N 4 pyramidal tip to locally diffract the light and cause the signal to propagate to the collecting fiber. High resolution imaging of Er-doped CaF 2 was demonstrated with a reported resolution on the order of 100 nm [5].…”

“…With the collecting probe fixed at a spot immediately adjacent to the point of electron beam excitation, the sample can be scanned underneath to produce a map of the spatial variations of the luminescence where the region from which the light is collected can be more restricted than in traditional far-field CL. Two different collecting approaches were initially demonstrated: 1) a high resolution SPM dielectric probe converting the local field into propagating waves which were then collected in the far-field by a fiber suspended about 50 μm above the sample [5] and 2) small diameter aperture fiber tips directly in SPM feedback just nanometers above the sample surface [6].…”

“…Figure 1 Schematic diagram of earliest systems to integrate near-field optical scanning microscopy into scanning electron microscopes. Upper: System of Troyon et al [5]. Lower: System of Cramer et al [6].…”

“…Integration for the primary purpose of collecting luminescence generated by an electron beam with a nearfield probe [near-field cathodoluminescence (CL)] was first presented in 1998 [5,6]. Troyon et al used a homebuilt scanning force microscope (SFM), with a laser-based cantilever deflection system and a four-quadrant photodetector.…”