2020
DOI: 10.1016/j.elspec.2019.05.014
|View full text |Cite
|
Sign up to set email alerts
|

Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
10
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
3
2

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(10 citation statements)
references
References 30 publications
0
10
0
Order By: Relevance
“…In recent experiments it was found that excited electrons in SEM could escape from the tip-target junction, helping in building new electronic systems based on polarized spin at nanoscale. Bertolini and co-authors [148] reported for the first time the scanning field emission microscopy with polarization analysis (SFEMPA). In SFEMPA a STM tip is held on one side and the spin polarization generated by electron scattering, thus providing the entire magnetic detail.…”
Section: Scanning Electron Microscopy With Polarization Analysis (Sempa)mentioning
confidence: 99%
“…In recent experiments it was found that excited electrons in SEM could escape from the tip-target junction, helping in building new electronic systems based on polarized spin at nanoscale. Bertolini and co-authors [148] reported for the first time the scanning field emission microscopy with polarization analysis (SFEMPA). In SFEMPA a STM tip is held on one side and the spin polarization generated by electron scattering, thus providing the entire magnetic detail.…”
Section: Scanning Electron Microscopy With Polarization Analysis (Sempa)mentioning
confidence: 99%
“…25,26 Q is a parameter taking into account instrumental asymmetries 25 not related to Pñ : it is determined by averaging online the counting rates over a region of the target with vanishing magnetization (e.g., the Wsurface). 24 Our instrument is able to detect simultaneously two components of the spin polarization vector: P x along the x-direction (Fig. 1), corresponding to one in-plane component of the target magnetization vector, and the component P z along the z-direction, corresponding to the component of the magnetization vector perpendicular to the target plane.…”
mentioning
confidence: 99%
“…21 The technology was called with an acronym that describes its dual origin: SFEMPA, standing for Scanning Field Emission with Polarization Analysis. 24 Preliminary experiments (using some image processing) detected the magnetization of uniformly magnetized thin elements. The imaging with SFEMPA of a nonuniformly magnetized thin film with juxtaposed domains of opposite magnetization vector, based on raw experimental data, was not achieved yet.…”
mentioning
confidence: 99%
See 2 more Smart Citations