2019
DOI: 10.1007/978-3-030-00069-1_5
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Scanning Electron Microscopy

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Cited by 35 publications
(17 citation statements)
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“…The signal resulting from interaction of the beam with the specimen is collected by a suitable electron detector and used to modulate the Cathode Ray Tube (CRT) brightness. In most applications, it is the low-energy secondary electrons, which are thus used to form a picture of the specimen on the CRT face (5) .…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The signal resulting from interaction of the beam with the specimen is collected by a suitable electron detector and used to modulate the Cathode Ray Tube (CRT) brightness. In most applications, it is the low-energy secondary electrons, which are thus used to form a picture of the specimen on the CRT face (5) .…”
Section: Methodsmentioning
confidence: 99%
“…SEM is a type of electron microscope that describes the sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample that make up the sample producing various signals that contain information about the sample surface topography, composition and properties (4,5) . The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image.…”
Section: Introductionmentioning
confidence: 99%
“…The specimens were transferred into iso-amyl acetate solution for 3 times, 20 min each and were dried [ 20 ]. Finally, the samples were coated by sputtering with IB-3 ion sputtering (Hitachi, Tokyo, Japan) [ 21 ].…”
Section: Methodsmentioning
confidence: 99%
“…The nanostructures of the aerogel samples were investigated with a Field Emission Scanning Electron Microscope (FESEM) [51,52]. Scanning electron microscopy operating at electron energies below 5 keV is usually termed Low Voltage Scanning Electron Microscopy (LVSEM) [53]. The advantages of low acceleration voltage derive directly from the energy dependence of the electron-specimen interactions.…”
Section: Low Voltage Scanning Electron Microscopy (Lvsem)mentioning
confidence: 99%