2021
DOI: 10.3390/cryst11091082
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Scanning Electron Microscopy Investigation of Surface Acoustic Wave Propagation in a 41° YX-Cut of a LiNbO3 Crystal/Si Layered Structure

Abstract: The propagation process of the surface acoustic waves (SAW) and the pseudo-surface acoustic waves (PSAW) in a bonded layered structure of a 41° YX-cut of a LiNbO3 crystal/Si(100) crystal was investigated. The scanning electron microscopy (SEM) method,in the low-energy secondary electrons registration mode, made it possible to visualize the SAW and PSAW in the LiNbO3/Si layered structure. The process of the SAW and PSAW propagation in a LiNbO3/Si layered structure and in a bulk 41° YX-cut of a LiNbO3 crystal we… Show more

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Cited by 4 publications
(4 citation statements)
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“…Conversely, when the thickness increases, the fluctuations are confined to the piezoelectric layer, which indicates that the thickness of the piezoelectric layer directly affects the velocity of the Rayleigh wave, which is consistent with the conclusions drawn in ref. [44]. The SAW velocity V for different types of double-layer substrate strucutre show significant differences.…”
Section: Saw Characteristics Of the Double-layer Piezoelectric Substratementioning
confidence: 95%
“…Conversely, when the thickness increases, the fluctuations are confined to the piezoelectric layer, which indicates that the thickness of the piezoelectric layer directly affects the velocity of the Rayleigh wave, which is consistent with the conclusions drawn in ref. [44]. The SAW velocity V for different types of double-layer substrate strucutre show significant differences.…”
Section: Saw Characteristics Of the Double-layer Piezoelectric Substratementioning
confidence: 95%
“…To study the process of the SAW propagation on the surface of a piezoelectric substrate with graphene, a scanning electron microscopy method was used to visualize the SAW in real time [28][29][30]. The process of the SAW propagation in the SAW delay time line was investigated using a JEOL JSM840 SEM at an electron probe current of 1 nA and an accelerating voltage of 1 kV.…”
Section: Investigation Of Saw Propagation In Graphene Film By Scannin...mentioning
confidence: 99%
“…The SAW image is formed in the mode of recording of low-energy secondary electrons with energy of ~1 eV, which are sensitive to the piezoelectric potential that accompanies the SAW propagation on the surface of the piezoelectric substrate. To study the process of the SAW propagation on the surface of a piezoelectric substrate with graphene, a scanning electron microscopy method was used to visualize the SAW in real time [28][29][30]. The process of the SAW propagation in the SAW delay time line was investigated using a JEOL JSM840 SEM at an electron probe current of 1 nA and an accelerating voltage of 1 kV.…”
Section: Investigation Of Saw Propagation In Graphene Film By Scannin...mentioning
confidence: 99%
“…The most promising methods for investigation of the SAW propagation process in solids are the methods of scanning electron microscopy [5][6][7][8][9] and X-ray topography and diffraction [10][11][12][13][14][15][16], that enable to visualize the acoustic waves on the crystal surface and to determine the parameters of acoustic wave propagation processes (wavelengths, acoustic wave amplitude, power flow angles, attenuation).…”
Section: Introductionmentioning
confidence: 99%