Scanning Compton X-ray microscopy

Villanueva-Pérez, P.; Fleckenstein, H.; Prasciolu, Mauro; Murray, Kevin T.; Domaracký, M.; Gregorič, Klara; Mariani, Valerio; Gelisio, Luca; Kuhn, Manuela; Hannappel, J.; Yefanov, Oleksandr; Ivanov, N. G.; Sarrou, Iosifina; Pennicard, D.; Becker, Julian; Zimmermann, M. v.; Gutowski, Olof; Dippel, Ann‐Christin; Chapman, Henry N.; Bajt, Saša

doi:10.1364/ol.421232

Cited by 7 publications

(4 citation statements)

References 25 publications

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“…After the deposition was finished the multilayer thickness profiles were determined by making "depth soundings" of the structure at a number of positions using a focused ion beam (FIB) 24 . This was used to identify the positions where layer spacing and layer tilt curvature matched the design 25 .…”

Section: Multilayer Laue Lensesmentioning

confidence: 99%

On the use of multilayer Laue lenses with X-ray free electron lasers

Prasciolu

Murray

Ivanov

et al. 2021

International Conference on X-Ray Lasers 2020

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Section: Multilayer Laue Lensesmentioning

confidence: 99%

On the use of multilayer Laue lenses with X-ray free electron lasers

Prasciolu

Murray

Ivanov

et al. 2021

International Conference on X-Ray Lasers 2020

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“…These wavelengths also provide longer working distances of diffractive lenses, an advantage for performing tomographic imaging. Recently, the use of even higher energy photons at 60 keV was investigated for a low-dose scanning microscopy based on Compton scattering 7 , 8 . In this approach, maps of the number of detected incoherently scattered photons as a function of the position of the focused beam provide images of the electron density of the sample.…”

Section: Introductionmentioning

confidence: 99%

Dose-efficient scanning Compton X-ray microscopy

Dresselhaus

Ivanov

et al. 2023

Light Sci Appl

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The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.

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“…Here, we examine achromat and apochromat designs to focus short-wavelength X-rays for imaging modalities such as scanning Compton X-ray microscopy [ 15 , 16 ], scanning fluorescence microscopy [ 3 ], ptychography [ 17 ] and projection imaging [ 18 ]. The achievable exposure times of these schemes are usually limited by the available flux that can be focused in a small spot, which could be significantly increased by the ability to accept a larger bandwidth from the source (such as the full width of a harmonic of an undulator device at a modern synchrotron radiation facility).…”

Section: Introductionmentioning

confidence: 99%

High-resolution achromatic X-ray optical systems for broad-band imaging and for focusing attosecond pulses

Chapman

Bajt

2021

Proc. R. Soc. A.

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Achromatic focusing systems for hard X-rays are examined which consist of a refractive lens paired with a diffractive lens. Compared with previous analyses, we take into account the behaviour of thick refractive lenses, such as compound refractive lenses and waveguide gradient index refractive lenses, in which both the focal length and the position of the principal planes vary with wavelength. Achromatic systems formed by the combination of such a thick refractive lens with a multilayer Laue lens are found that can operate at a focusing resolution of about 3 nm, over a relative bandwidth of about 1%. With the appropriate distance between the refractive and diffractive lenses, apochromatic systems can also be found, which operate over relative bandwidth greater than 10%. These systems can be used to focus short pulses without distorting them in time by more than several attoseconds. Such systems are suitable for high-flux scanning microscopy and for creating high intensities from attosecond X-ray pulses.

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Scanning Compton X-ray microscopy

Cited by 7 publications

References 25 publications

On the use of multilayer Laue lenses with X-ray free electron lasers

On the use of multilayer Laue lenses with X-ray free electron lasers

Dose-efficient scanning Compton X-ray microscopy

High-resolution achromatic X-ray optical systems for broad-band imaging and for focusing attosecond pulses

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