Scan-Line Quality Inspection of Strip Materials Using 1-D Radial Basis Function Network

Abstract

There exist a variety of manufacturing quality inspection tasks where the inspection of a continuous strip of material using a scan-line camera is involved. Here the image is very short in one dimension but unlimited in the other dimension. In this study, a method of image event detection for this class of applications based on adaptive radial-basis function networks is presented. The architecture of the system and the adaptation methodology is presented in detail together with a detailed discussion on parameter selection. Promising detection results are illustrated for an application to grinded glass edge inspection problem.